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oe1(光电查) - 科学论文

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出版时间
  • 2019
  • 2018
研究主题
  • JBSFET
  • Robustness
  • MOSFET
  • Reliability
  • Silicon Carbide
  • 4H-SiC
  • Failure Mechanism
  • Short Circuit
  • Ruggedness
  • silicon photonics
应用领域
  • Electrical Engineering and Automation
  • Optoelectronic Information Science and Engineering
  • Electronic Science and Technology
机构单位
  • North Carolina State University
  • MediaTek, Inc.
  • JCET STATS ChipPAC Pte. Ltd.
1248 条数据
?? 中文(中国)
  • An Improved Proposed Single Phase Transformerless Inverter with Leakage Current Elimination and Reactive Power Capability for PV Systems Application

    摘要: Single-phase transformerless inverters are broadly studied in literature for residential-scale PV applications due to their great advantages in reducing system weight, cost and elevating system efficiency. The design of transformerless inverters is based on the galvanic isolation method to eliminate the generation of leakage current. Unfortunately, the use of the galvanic isolation method alone cannot achieve constant common mode voltage (CMV). Therefore, a complete elimination of leakage current cannot be achieved. In addition, modulation techniques of single-phase transformerless inverters are designed for the application of the unity power factor. Indeed, next-generation PV systems are required to support reactive power to enable connectivity to the utility grid. In this paper, a proposed single-phase transformerless inverter is modified with the clamping method to achieve constant CMV during all inverter operating modes. Furthermore, the modulation technique is modified by creating a new current path in the negative power region. As a result, a bidirectional current path is created in the negative power region to achieve reactive power generation. The simulation results show that the CMV is completely clamped at half the DC link voltage and the leakage current is almost completely eliminated. Furthermore, a reactive power generation is achieved with the modified modulation techniques. Additionally, the total harmonic distortion (THD) of the grid current with the conventional and a modified modulation technique is analyzed. The efficiency of the system is enhanced by using wide-bandgap (WBG) switching devices such as SiC MOSFET. It is observed that the efficiency of the system decreased with reactive power generation due to the bidirectional current path, which leads to increasing conduction losses.

    关键词: leakage current,transformerless inverter,reactive power,wide-bandgap (WBG),silicon carbide (SiC),photovoltaic (PV) power system

    更新于2025-09-23 15:23:52

  • Germanium catalyzed vapor–liquid–solid growth and characterization of amorphous silicon oxide nanotubes: comparison to the growth of its nanowires

    摘要: One-dimensional (1D) nanostructures were grown with a simple technique using continuous-wave laser vaporization of a Ge target containing 5 at.% Si in high-pressure (up to 0.9 MPa) Ar gas atmosphere. A maximum amount (~ 30% of all products) of 1D nanostructures was obtained at 0.9 MPa and these nanostructures were identified as amorphous silicon oxide (SiOx) nanotubes (NTs) and attached with crystalline Ge-rich NPs with elongated prolate-like or sphere-like shapes at their tips by transmission electron microscopy (TEM), high-angle annular dark-field-scanning TEM, and energy dispersive X-ray line scan spectrometry. As the Ar pressure decreased from 0.9 to 0.03 MPa, the average diameters, wall thicknesses, and lengths of the NTs decreased from 57.9 to 22.9 nm, 13.2 to 6.7 nm, and 2.1 to 0.2 μm, respectively, and the tip NP size decreased from 139.0 to 41.7 nm. There was a strong correlation among the diameters, wall thicknesses, and lengths of the NTs and tip Ge NP sizes, indicating the role of molten Ge NPs as catalyst seeds for the precipitation of SiOx in a vapor–liquid–solid growth mechanism at high temperature. The SiOx precipitation quantities from the seed NPs for the NTs were compared with those of amorphous SiOx nanowires (NWs) at 0.1–0.9 MPa to clarify the growth mechanism of the NTs. We argue that smaller precipitation quantities of SiOx than those for the NWs play a critical role in the formation of cap structures with different sizes and shapes from the molten Ge NPs and the growth of the NTs.

    关键词: Laser vaporization,Germanium catalyst,Silicon oxide,Nanotube,Nanowire

    更新于2025-09-23 15:23:52

  • Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption

    摘要: Depth profiling of the ambipolar carrier lifetime was performed in n-type, 140μm thick silicon carbide (SiC) epilayer using excitation by two-photon absorption (TPA) with a pulsed 586nm laser, and confocal measurement of time resolved photoluminescence (TRPL) decay from the excited region. A depth resolution of ≈10μm was obtained. The PL decay curves were analyzed using a recently developed formalism that takes into account the TPA excitation, carrier diffusion and surface/interface recombination. The carrier lifetime decreases near the top surface of the epitaxial layer as well as near its interface with the substrate.

    关键词: Carrier lifetime profiling,Silicon Carbide

    更新于2025-09-23 15:23:52

  • Electrical Properties of Porous Silicon for N2 Gas Sensor

    摘要: The application of porous silicon (PSi) for gas sensing devices has gained a considerable attention in the last decade. This work considers the electrical features of PSi layers prepared by electrochemical etching. We find that in order to get a better understanding of the absorption properties of PSi surface, it is necessary to know how the PSi morphology depends on the etching parameters. The physical structure of PSi, i.e., porosity, and pore size distribution can be controlled by changing the Hydrofluoric Acid concentration, current density, anodizing length and etching time in anodizing procedure. We describe our test system for gas sensors and investigate on the electrical behavior of PSi layers (p-type) in N2 gas for various fabrication conditions. The results show that the current density increases significantly as N2 gas is adsorbed. The measurements of the I-V characteristics were carried out at atmospheric pressure, room temperature, and with N2 gas as well.

    关键词: Current-voltage curve,N2 gas,Porous silicon,Gas sensor

    更新于2025-09-23 15:23:52

  • One-pot green synthesis of highly luminescent silicon nanoparticles using Citrus limon (L.) and their applications in luminescent cell imaging and antimicrobial efficacy

    摘要: Strongly luminescent and water dispersible silicon nanoparticles were synthesised by one-pot synthesis from venyl-trimethoxy-silane and (3-aminopropyl)-triethoxy-silane using both chemical and green reducing agents, sodium ascorbate and Citrus limon (L.) respectively. Unlike sodium ascorbate, the reduction using lemon extracts produces smaller nanoparticles with average size of 20 and 57 nm. The antimicrobial e?cacy of the nanoparticles is examined against various microorganisms and is noted that these particles possessed antibacterial property if used in concentrations above the threshold value of 1.5 μg/ml. In addition, these silicon nanoparticles emit intense blue-green emission which is successfully utilised for the luminescent cell imaging of human white blood cells and mice epithelial cells.

    关键词: Luminescence,Citrus limon (L.),Silane,Silicon nanoparticle,Cell imaging.

    更新于2025-09-23 15:23:52

  • Low temperature characteristics of SiPMs after very high neutron irradiation

    摘要: The design of the CMS phase II upgrade for the HL-LHC uses SiPMs for the Barrel Timing Layer (BTL) and the Behind HCAL detector (BH or CEH). In both sub-detectors the SiPMs will see a 1 MeV equivalent dose of around 1014 n/cm2. To lower the noise in the SiPMs the design is to keep the SiPMs at a low temperature of ?30 ?C. Different samples from two manufactures of SiPMs were irradiated to a total dose of resp. 2 × 1012, 5 × 1013 at the TRIGA reactor at the JSI in Slovenia. The noise in SiPMs is dominated by trap assisted tunneling which is a result of the high internal electric field in SiPMs. We therefore studied the noise behavior from +10 ?C to ?40 ?C from standard high internal field and specially designed low field SiPMs from FBK-irst and Hamamatsu. After the initial characterization before annealing the noise decrease in SiPMs was also studied using accelerated annealing.

    关键词: Silicon photomultiplier,MPPC,CMS,GAPD,Radiation damage

    更新于2025-09-23 15:23:52

  • Combustion synthesis of α-Si3N4 with green additives

    摘要: This paper reports the combustion synthesis of α-Si3N4 using green additives of water and alcohol. The addition of water and alcohol is demonstrated to be effective in controlling the reaction kinetics and improving the formation of α-Si3N4 by vapor reactions. With increasing proportion of additives in the starting composition, the content of α-Si3N4 in the product is clearly enhanced. In contrast to the ammonium halides usually employed as additives in the combustion synthesis of α-Si3N4, the green additives used here are nontoxic, noncorrosive, and thus more attractive for industrial applications.

    关键词: Silicon nitride,Combustion synthesis

    更新于2025-09-23 15:23:52

  • Absence of free carriers in silicon nanocrystals grown from phosphorus- and boron-doped silicon-rich oxide and oxynitride

    摘要: Phosphorus- and boron-doped silicon nanocrystals (Si NCs) embedded in silicon oxide matrix can be fabricated by plasma-enhanced chemical vapour deposition (PECVD). Conventionally, SiH4 and N2O are used as precursor gasses, which inevitably leads to the incorporation of ≈10 atom % nitrogen, rendering the matrix a silicon oxynitride. Alternatively, SiH4 and O2 can be used, which allows for completely N-free silicon oxide. In this work, we investigate the properties of B- and P-incorporating Si NCs embedded in pure silicon oxide compared to silicon oxynitride by atom probe tomography (APT), low-temperature photoluminescence (PL), transient transmission (TT), and current–voltage (I–V) measurements. The results clearly show that no free carriers, neither from P- nor from B-doping, exist in the Si NCs, although in some configurations charge carriers can be generated by electric field ionization. The absence of free carriers in Si NCs ≤5 nm in diameter despite the presence of P- or B-atoms has severe implications for future applications of conventional impurity doping of Si in sub-10 nm technology nodes.

    关键词: photoluminescence,silicon nanocrystals,transient transmission,doping,atom probe tomography

    更新于2025-09-23 15:23:52

  • Interfacial Contact is Required for Metal-Assisted Plasma Etching of Silicon

    摘要: For decades, fabrication of semiconductor devices has utilized well-established etching techniques to create complex nanostructures in silicon. The most common dry process is reactive ion etching which fabricates nanostructures through the selective removal of unmasked silicon. Generalized enhancements of etching have been reported with mask-enhanced etching with Al, Cr, Cu, and Ag masks, but there is a lack of reports exploring the ability of metallic films to catalytically enhance the local etching of silicon in plasmas. Here, metal-assisted plasma etching (MAPE) is performed using patterned nanometers-thick gold films to catalyze the etching of silicon in an SF6/O2 mixed plasma, selectively increasing the rate of etching by over 1000%. The catalytic enhancement of etching requires direct Si-metal interfacial contact, similar to metal-assisted chemical etching (MACE), but is different in terms of the etching mechanism. The mechanism of MAPE is explored by characterizing the degree of enhancement as a function of Au catalyst configuration and relative oxygen feed concentration, along with the catalytic activities of other common MACE metals including Ag, Pt, and Cu.

    关键词: nanofabrication,MACE,silicon processing,reactive ion etching,metal assisted etching

    更新于2025-09-23 15:23:52

  • A novel silicon heterojunction IBC process flow using partial etching of doped a-Si:H to switch from hole contact to electron contact <i>in situ</i> with efficiencies close to 23%

    摘要: We present a novel process sequence to simplify the rear‐side patterning of the silicon heterojunction interdigitated back contact (HJ IBC) cells. In this approach, interdigitated strips of a‐Si:H (i/p+) hole contact and a‐Si:H (i/n+) electron contact are achieved by partially etching a blanket a‐Si:H (i/p+) stack through an SiOx hard mask to remove only the p+ a‐Si:H layer and replace it with an n+ a‐Si:H layer, thereby switching from a hole contact to an electron contact in situ, without having to remove the entire passivation. This eliminates the ex situ wet clean after dry etching and also prevents re‐exposure of the crystalline silicon surface during rear‐side processing. Using a well‐controlled process, high‐quality passivation is maintained throughout the rear‐side process sequence leading to high open‐circuit voltages (VOC). A slightly higher contact resistance at the electron contact leads to a slightly higher fill factor (FF) loss due to series resistance for cells from the partial etch route, but the FF loss due to J02‐type recombination is lower, compared with reference cells. As a result, the best cell from the partial etch route has an efficiency of 22.9% and a VOC of 729 mV, nearly identical to the best reference cell, demonstrating that the developed partial etch process can be successfully implemented to achieve cell performance comparable with reference, but with a simpler, cheaper, and faster process sequence.

    关键词: interdigitated back contact (IBC),H2 plasma,amorphous silicon,heterojunction,dry etch,process simplification,NF3/Ar plasma,in situ processing

    更新于2025-09-23 15:23:52