研究目的
Investigating the effects of repulsive magnetic field–assisted laser-induced plasma micromachining on the quality of microfabrication on single-crystal silicon.
研究成果
Repulsive magnetic field–assisted LIPMM significantly improves the quality of machined single-crystal silicon surfaces by reducing recast layers and thermal defects, and by decreasing the line width of processed micro-grooves by 30%. The Lorentz force and electromagnetic interactions under the repulsive magnetic field effectively regulate the LIPMM process.
研究不足
The study focuses on single-crystal silicon and may not directly apply to other materials. The effects of varying magnetic field strengths and configurations were not explored.
1:Experimental Design and Method Selection:
The study compares laser direct writing, ethanol-assisted laser writing, and laser-induced plasma micromachining (LIPMM) with and without a repulsive magnetic field.
2:Sample Selection and Data Sources:
Single-crystal silicon wafers were used as the processing object.
3:List of Experimental Equipment and Materials:
An industrial-grade femtosecond laser (Spectra-Physics, Spirit One 1040-8-SHG), a laser processing system (Newport femtoFBG), strong NdFeB permanent magnets, and ethanol as the medium solution.
4:Experimental Procedures and Operational Workflow:
The laser focus was positioned above the silicon workpiece, and the effects of different processing methods were compared.
5:Data Analysis Methods:
Surface morphology was analyzed using a scanning electron microscope (Zeiss Merlin) and an optical microscope (Axio Observer 3, Zeiss).
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femtosecond laser
Spirit One 1040-8-SHG
Spectra-Physics
Used for laser-induced plasma micromachining
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scanning electron microscope
Merlin
Zeiss
Observes and analyzes the surface morphology after laser processing
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optical microscope
Axio Observer 3
Zeiss
Observes and analyzes the surface morphology after laser processing
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laser processing system
femtoFBG
Newport
Controls the average laser power delivered to the sample
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Gauss meter
CH-1500
CH-Hall Electronic devices
Measures magnetic field strength
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