研究目的
Investigating the influence of sample temperature on the optical emission of laser-induced molybdenum-tungsten plasma for in-situ elemental analysis of nuclear materials.
研究成果
The study demonstrates that sample temperature significantly affects the optical emission of laser-induced plasma, with higher temperatures leading to increased spectral line emissions. This finding is crucial for improving LIBS quantitative analysis of high Z impurities in tokamak devices.
研究不足
The study is limited to a specific molybdenum-tungsten alloy and may not be directly applicable to other materials. The experiments were conducted at atmospheric pressure, which may not fully replicate conditions in a tokamak.
1:Experimental Design and Method Selection:
A Q-switched Nd:YAG laser was used as the ablation source to create plasma on a molybdenum-tungsten alloy sample. The spectral emission of the plasma was detected and analyzed.
2:Sample Selection and Data Sources:
A certified molybdenum-tungsten alloy (Mo 70 wt.% and W 30 wt.%) was used as the sample. The sample was heated to various temperatures from 20 to 410 ℃.
3:List of Experimental Equipment and Materials:
Nd:YAG laser (Lapa-80, Beamtech), dichroic mirrors (DMSP950, Thorlabs; DMLP 567, Thorlabs), laser power meter (842-PE, Newport), Echelle spectrograph with ICCD (iStar DH334T, Andor), SEM (Quanta 450, FEI), white-light interferometry (New View 6 K, Zygo Corporation).
4:Experimental Procedures and Operational Workflow:
The laser was directed onto the sample surface, and the emitted spectra were captured. The sample temperature was varied, and the effects on plasma emission were studied.
5:Data Analysis Methods:
The spectral line intensities were analyzed to determine the plasma temperature and electron density. The surface morphology and crater profiles were examined using SEM and white-light interferometry.
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Dichroic mirror
DMSP950
Thorlabs
Directing the laser beam normal to the sample surface.
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Dichroic mirror
DMLP 567
Thorlabs
Detecting the spectral emission of the laser-induced plasma.
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Echelle spectrograph with ICCD
iStar DH334T
Andor
Detecting and analyzing the spectral emission of the plasma.
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SEM
Quanta 450
FEI
Examining the irradiated samples for surface morphology and elemental analysis.
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White-light interferometry
New View 6 K
Zygo Corporation
Measuring the crater profiles.
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Nd:YAG laser
Lapa-80
Beamtech
Ablation source for creating plasma on the sample surface.
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Laser power meter
842-PE
Newport
Measuring the pulse energy after the focusing lens.
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