研究目的
Investigating a new near-field method based on the inversion of the overlap integral for determining the refractive index distribution of waveguides.
研究成果
The study introduces a new technique to determine the refractive index distribution of waveguides by shifting the input excitation and using deconvolution techniques on the overlap. The waveguide profile is accurately reconstructed by fitting the mode tails with a decaying exponential, showing a 10% error with respect to the original waveguide. This method finds direct applications in investigating index profiles of femtosecond-written waveguides.
研究不足
The method's accuracy is affected by the signal-to-noise ratio, and direct application of the inversion protocol can enhance noise, especially on the tails of the mode. The technique requires simultaneous measurement of both amplitude and phase of the transmitted field for multimodal waveguides.
1:Experimental Design and Method Selection:
The study presents a new near-field method based on the inversion of the overlap integral for determining the refractive index profile of waveguides. The method involves measuring the transmitted field and computing the refractive index profile by direct inversion of the Helmholtz equation.
2:Sample Selection and Data Sources:
The method is applicable to various guiding structures, including optical fibers and femtosecond-written waveguides.
3:List of Experimental Equipment and Materials:
Not explicitly mentioned.
4:Experimental Procedures and Operational Workflow:
The procedure involves shifting the input excitation and using deconvolution techniques to find the mode from the overlap. The waveguide profile is then found by using an analytical approximation for the tails of the field.
5:Data Analysis Methods:
The analysis involves inverting the overlap integral and fitting the mode tails with a decaying exponential to overcome noise enhancement.
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