研究目的
Investigating the effects of thickness control and surface modification of the TiO2 electron transport layer on the performance of planar perovskite solar cells.
研究成果
The study demonstrated that optimizing the thickness of the TiO2 electron transport layer and TiCl4 treatment conditions can significantly enhance the performance of planar perovskite solar cells. The introduction of ethanol into TiCl4 solutions improved device efficiency by reducing surface traps and charge recombination. The highest PCE achieved was 19.24%, highlighting the potential of simple planar PSCs without complex compositional engineering.
研究不足
The study focused on planar PSCs and did not explore mesoporous structures. The effects of TiCl4 treatment on charge transport kinetics were not deeply investigated. The study was limited to a specific range of TiO2 thicknesses and TiCl4 treatment conditions.
1:Experimental Design and Method Selection:
The study involved the fabrication of planar perovskite solar cells with varying thicknesses of the TiO2 electron transport layer and different TiCl4 treatment times. The impact of these variations on the photovoltaic performance was analyzed.
2:Sample Selection and Data Sources:
Samples were prepared by spin-coating TiO2 layers of different thicknesses on FTO glass, followed by TiCl4 treatment in aqueous or aqueous/ethanol solutions.
3:List of Experimental Equipment and Materials:
Equipment included a spin coater, SEM, AFM, UV-vis spectrometer, PL spectrometer, and solar simulator. Materials included TiO2, TiCl4, MAPbI3 perovskite, and Spiro-MeOTAD.
4:Experimental Procedures and Operational Workflow:
The TiO2 layer thickness was controlled by spin-coating speed, followed by TiCl4 treatment. Perovskite layers were deposited via spin-coating, and devices were completed with Spiro-MeOTAD and silver electrodes.
5:Data Analysis Methods:
Photovoltaic performance was evaluated using J-V curves, EIS, and PL quenching tests.
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AFM
NanosurfEasyscan
Nanosurf
Characterization of surface morphology of TiO2 films.
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UV/Vis/NIR spectrometer
Lambda 750S
Perkin Elmer
Measurement of UV-vis absorption and transmittance spectra.
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X-ray diffractometer
D8 Discover
Bruker
Characterization of XRD patterns of perovskite and TiO2 films.
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PL spectrometer
Lifespec-PS
Edinburgh Instruments
Recording of photoluminescence spectrum of perovskite film.
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SEM
ZEISS EVO/LS15
ZEISS
Characterization of perovskite films and cross-sections of different layers on FTO glass.
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Profilometer
Bruker
Measurement of the thickness of compact TiO2 layer.
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Solar simulator
Model 94021A
Oriel Instruments
Measurement of photocurrent density–voltage characteristics under illumination.
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Potentiostat
Interface1000E
Gamry Instruments
Performance of electrical impedance spectroscopy measurements.
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