研究目的
To suppress the viewing angle dependence of top emission organic emitting diodes (TEOLEDs) with strong microcavity effect by introducing randomly distributed nano-wrinkle structure beneath highly reflective anode and to compensate the current efficiency reduction by introducing index matching epoxy filler between encapsulation glass and TEOLED device.
研究成果
The study successfully suppressed the viewing angle dependence and color shift of TEOLEDs by introducing randomly distributed nano-wrinkle structure beneath highly reflective anode. The current efficiency reduction was compensated by introducing index matching epoxy filler between encapsulation glass and TEOLED device. The devices with nano-wrinkle structure showed perfect black state when a circular polarizer film was attached.
研究不足
The introduction of nano-wrinkle structure beneath the reflective anode reduces the current efficiency more than half. The efficiency drop can be compensated by introducing index matching epoxy filler, but the process is complex and may affect the optical properties of the device.
1：Experimental Design and Method Selection:
The study introduced randomly distributed nano-wrinkle structure beneath highly reflective anode to suppress the viewing angle dependence of TEOLEDs. Index matching epoxy filler was used between encapsulation glass and TEOLED device to compensate the current efficiency reduction.
2：Sample Selection and Data Sources:
TEOLED devices with and without nano-wrinkle structure were fabricated and compared. The performance of these devices was measured using various instruments.
3：List of Experimental Equipment and Materials:
Polydimethylsiloxane (PDMS) film, aluminium (Al), silver (Ag), molybdenum trioxide (MoO3), N,N'-bis(naphthalen-1-yl)-N,N'-bis(phenyl)benzidine (NPB), 1,4,5,8,9,11-hexaazatriphenylene hexacarbonitrile (HAT-CN), beryllium bisbenzo[h]quinolin-10-olate (Bebq2), bis[2,4-dimethyl-6-(4-methyl-2-quinolinyl-κN)phenyl-κC](2,2,6,6-tetramethyl-3,5-heptanedionato-κO3) (Ir(mphmq)2(tmd)), 4,7-diphenyl-1,10-phenanthroline (BPhen), lithium quinolate (Liq), and NOA 81 (NORLAND PRODUCTS) were used.
4：Experimental Procedures and Operational Workflow:
The nano-wrinkle structure was prepared by spin-coating and thermal evaporation process. TEOLED devices were fabricated by thermal evaporation method. The performance of the devices was measured using power measurement unit and spectrophotometer.
5：Data Analysis Methods:
The current density, current efficiency, power efficiency, external quantum efficiency, color coordinates, and electroluminescence spectra were analyzed.
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NOA 81
NOA 81
NORLAND PRODUCTS
Used as index matching epoxy filler and for creating rigid wrinkle structure.
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Polydimethylsiloxane
PDMS
Used as a film on the glass substrate for creating nano-wrinkle structure.
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Aluminium
Al
Deposited on annealed PDMS film to create nano-wrinkle structure.
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Silver
Ag
Used as a highly reflective anode for TEOLED.
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Molybdenum trioxide
MoO3
Used as a hole injection layer (HIL) and inorganic capping layer.
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N,N'-bis(naphthalen-1-yl)-N,N'-bis(phenyl)benzidine
NPB
Used as a hole transport layer (HTL) and an electron blocking layer (EBL).
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1,4,5,8,9,11-hexaazatriphenylene hexacarbonitrile
HAT-CN
Used as a charge generation layer (CGL).
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Beryllium bisbenzo[h]quinolin-10-olate
Bebq2
Used as host material for an emission layer (EML).
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bis[2,4-dimethyl-6-(4-methyl-2-quinolinyl-κN)phenyl-κC](2,2,6,6-tetramethyl-3,5-heptanedionato-κO3)
Ir(mphmq)2(tmd)
Used as dopant material for an emission layer (EML).
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4,7-diphenyl-1,10-phenanthroline
BPhen
Used as an electron transport layer (ETL) and a hole blocking layer.
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Lithium quinolate
Liq
Used as an electron injection layer (EIL).
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Silver doped magnesium
Mg:Ag
Used as a cathode.
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UV light curing resin
XNR5570
Nagase ChemteX Corp.
Used for covering the device after fabrication.
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