研究目的
Investigating the thermal stability improvement of inverted perovskite photovoltaics through nanoparticulate metal oxide top electrode interface modification.
研究成果
The incorporation of a γ-Fe2O3 interfacial layer between PC(70)BM and Al in inverted perovskite solar cells results in improved thermal stability under accelerated heat conditions, attributed to the acidic surface nature of γ-Fe2O3 and reduced charge trap density. This modification provides a promising approach for enhancing the long-term stability of perovskite photovoltaics.
研究不足
The study focuses on thermal stability under accelerated heat conditions and N2 atmosphere, but does not address stability under other environmental stresses such as moisture or light soaking. The use of a basic perovskite CH3NH3PbI3 formulation may limit the generalizability to other perovskite compositions.
1：Experimental Design and Method Selection:
Solvothermal colloidal synthesis in conjunction with ligand-exchange method for γ-Fe2O3 nanoparticles.
2：Sample Selection and Data Sources:
Inverted perovskite solar cells with different top electrodes (PC(70)BM/Al, PC(70)BM/AZO/Al, PC(70)BM/γ-Fe2O3/Al).
3：List of Experimental Equipment and Materials:
Veeco Dektak 150 profilometer, PANanalytical X’pert Pro MPD X-ray diffractometer, Botest LIV Functionality Test System, Newport Solar simulator, Metrohm Autolab PGSTAT 302N equipped with FRA32M module, Shimadzu UV-2700 UV–vis spectrophotometer, Nanosurf easy scan 2 AFM, JEOL Model JEM-2100 TEM.
4：Experimental Procedures and Operational Workflow:
Fabrication of inverted perovskite solar cells, characterization of materials and devices, accelerated heat lifetime testing.
5：Data Analysis Methods:
Impedance spectroscopy, Mott-Schottky analysis, J-V characterization, PL spectroscopy.
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Metrohm Autolab PGSTAT 302N
PGSTAT 302N
Metrohm
Performing impedance spectroscopy and Mott-Schottky measurements
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Shimadzu UV-2700 UV–vis spectrophotometer
UV-2700
Shimadzu
Performing transmittance and absorption measurements
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Nanosurf easy scan 2
easy scan 2
Nanosurf
Obtaining atomic force microscopy (AFM) images
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JEOL Model JEM-2100
JEM-2100
JEOL
Taking transmission electron microscopy (TEM) images
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Veeco Dektak 150 profilometer
150
Veeco
Measuring the thicknesses and the surface profile of the device layers
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PANanalytical X’pert Pro MPD X-ray diffractometer
X’pert Pro MPD
PANanalytical
Collecting wide-angle XRD patterns
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Botest LIV Functionality Test System
LIV Functionality Test System
Botest
Characterizing the current density-voltage (J/V) characteristics
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Newport Solar simulator
Newport
Providing illumination for device characterization
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