研究目的
To propose a new architecture of the SPR sensor with an electrical response in which the integrated hot-electron photodetector replaces the traditional spectrometer, aiming for miniaturization and improved sensitivity.
研究成果
The integration of the MIM junction and optical waveguide in the Kretschmann setup allows for an SPR sensor with an electrical response, demonstrating high sensitivity and potential for miniaturization. The addition of an ITO layer improves performance, achieving an electrical sensitivity of 12.5 V/RIU.
研究不足
The detectable refractive index range of the proposed sensor is determined by the bandwidth of the incident light spectrum, limiting its linear range to 1.3320–1.333.
1:Experimental Design and Method Selection:
The study integrates a metal–insulator–metal (MIM) junction and planar waveguide (PWG) as a multilayer structure, excited by a broad-spectrum LED in the near-IR region. The coupling between the SPP mode of the MIM junction and the PWG mode is analyzed.
2:Sample Selection and Data Sources:
The structure includes an oxide layer (ZnO) sandwiched between two Ag layers, with Cytop and polyethylene terephthalate (PET) as the coupler and waveguide layers.
3:List of Experimental Equipment and Materials:
A p-polarized LED light source with a Gaussian spectrum centered at 820 nm, SF10 coupling prism, Ag and ZnO layers, Cytop, and PET.
4:Experimental Procedures and Operational Workflow:
The device is illuminated, and the electrical response to changes in the analyte refractive index is measured, focusing on the open-circuit voltage (Voc) of the MIM junction.
5:Data Analysis Methods:
The transfer matrix method (TMM) is used to investigate the optical response and calculate the absorbed power density in the proposed device.
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