研究目的
Addressing the issue of poor interface contact between chalcogenides and oxides in CdS modified TiO2 materials, which leads to inefficient separation and transport of charges during the PEC water splitting process.
研究成果
The post-annealing process can cause simultaneous enhancement of A-CdS/TNAs photoanodes, including both the improvement of visible light absorption and accelerated separation of photogenerated electrons/holes. As a result, the A-CdS/TNAs photoanodes exhibited the best PEC performance, and its photocurrent density and STH conversion efficiency reached 4.56 mA cm?2 at 1.23 VRHE and 5.61%, respectively.
研究不足
The technical and application constraints of the experiments, as well as potential areas for optimization, are not explicitly mentioned in the provided text.
1:Experimental Design and Method Selection:
The CdS/TiO2 nanotube array (CdS/TNA) photoanode was fabricated through a successive ion layer absorption and reaction (SILAR) method with an additional subsequent annealing.
2:Sample Selection and Data Sources:
TNAs obtained by the anodization method were decorated with CdS nanoparticles through a six-cycle SILAR process.
3:List of Experimental Equipment and Materials:
SEM (S4800, Hitachi, Japan), FE-TEM (Tecnai-G2F20, FEI, Holland), XRD (Rigaku D/max 2500 v/pc, Japan), micro-Raman spectroscopy (LabRAM Aramis, HORIBA Scientific, Japan), XPS (PHI-5000 VersaProbe, ULVCA-PHI Co., USA), UV–vis spectrophotometer (UV3600, Hitachi, Japan), fluorescence spectrophotometer (F-4600, Hitachi, Japan).
4:Experimental Procedures and Operational Workflow:
The TNAs were decorated with CdS nanoparticles through a six-cycle SILAR process, followed by a post-annealing treatment of 300 °C for 30 min in Ar atmosphere.
5:Data Analysis Methods:
The crystal structures of the materials were studied by XRD and micro-Raman spectroscopy. The surface chemical status of the materials was analyzed by XPS. UV–vis diffuse reflectance spectra (DRS) of the samples were collected in the range of 300–700 nm. Photo-luminescence (PL) spectra were collected under an excitation wavelength of 325 nm.
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XRD
Rigaku D/max 2500 v/pc
Rigaku
Study of the crystal structures of the materials
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micro-Raman spectroscopy
LabRAM Aramis
HORIBA Scientific
Study of the crystal structures of the materials
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UV–vis spectrophotometer
UV3600
Hitachi
Collection of UV–vis diffuse reflectance spectra (DRS) of the samples
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fluorescence spectrophotometer
F-4600
Hitachi
Collection of photo-luminescence (PL) spectra
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SEM
S4800
Hitachi
Characterization of the surface and cross-sections of the TNAs
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FE-TEM
Tecnai-G2F20
FEI
Observation of the micromorphologies of the samples
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XPS
PHI-5000 VersaProbe
ULVCA-PHI
Analysis of the surface chemical status of the materials
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