研究目的
To develop a novel fault diagnosis algorithm for a PV DC/AC grid tied inverter that can detect and identify short-circuit (SC) and open-circuit (OC) faults in semiconductor devices, enabling continuous operation post-fault.
研究成果
The developed fault diagnosis algorithm effectively identifies different fault types in 1-2 switching cycles, crucial for protecting the inverter from faults that can damage MOSFETs. The method combines inductor current estimation and output voltage behavior analysis, proving efficient for both buck converter and PV inverter applications.
研究不足
The sensitivity of the algorithm is dependent on the threshold values for fault detection variables. The study focuses on H-bridge topology and may not cover all inverter configurations.
1：Experimental Design and Method Selection:
The study approximates the H-bridge inverter as a synchronous switching buck converter, leveraging the grid frequency being much lower than the inverter switching frequency for fault diagnosis.
2：Sample Selection and Data Sources:
The input DC voltage considered was 220V, with output specifications at single phase, 120 RMS voltage and 50Hz with a power rating of 1kW.
3：List of Experimental Equipment and Materials:
The study uses an H-bridge inverter topology with switches operating at different frequencies, fuses for each switch to prevent overcurrent, and TRIACs for each leg for fault isolation.
4：Experimental Procedures and Operational Workflow:
The inverter response to different faulty conditions is simulated, including healthy state, OC switch fault, and SC switch fault scenarios.
5：Data Analysis Methods:
The algorithm combines inductor current estimation and incremental output voltage behaviors for fault detection and classification.
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