研究目的
To increase the thickness of (K0.88Na0.12)NbO3 films on Ni-based alloy substrates by repeating the hydrothermal cycles and investigate their crystal structure and ferroelectric and piezoelectric properties as a function of film thickness.
研究成果
Repeated hydrothermal deposition technique is effective for preparing thick (K,Na)NbO3 films on metal substrates with controlled orientation. The films showed consistent ferroelectric and piezoelectric properties regardless of thickness, making them suitable for applications requiring flexible piezoelectric films.
研究不足
The study is limited to the deposition of (K,Na)NbO3 films on Ni-based alloy substrates with specific buffer layers. The maximum thickness achieved was 27 μm. The properties of the films were not compared with other deposition techniques or substrates.
1：Experimental Design and Method Selection:
(K0.88Na0.12)NbO3 films were prepared at 240°C by hydrothermal method on Ni-based alloy substrates with SrRuO3/LaNiO3 and SrRuO3 buffer layers. The hydrothermal process was repeated to increase film thickness.
2：88Na12)NbO3 films were prepared at 240°C by hydrothermal method on Ni-based alloy substrates with SrRuO3/LaNiO3 and SrRuO3 buffer layers. The hydrothermal process was repeated to increase film thickness.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Metal substrates used were Ni-based alloy (Inconel 600) with SrRuO3/LaNiO3 and SrRuO3 buffer layers.
3：List of Experimental Equipment and Materials:
Autoclave, Te?on bottle, X-ray fluorescence spectroscopy (XRF, Panalytical Axios Advance PW4400), XRD (Bruker D8 DISCOVER), SEM (JEOL JEM-6610LA), AFM (SII SPA400).
4：0).
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The substrates were suspended in a Te?on bottle with a mixed solution of KOH and NaOH and Nb2O5 powder, heated at 240°C for 6 h, cleaned, and dried. This process was repeated up to four times.
5：Data Analysis Methods:
Film thickness and composition were determined by XRF. Crystal structure and orientation were characterized by XRD. Surface morphologies were observed by SEM. Ferroelectric and piezoelectric properties were measured using a ferroelectric tester and AFM.
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