研究目的
Investigating the efficiency enhancement of OLEDs with applied external scattering layers.
研究成果
The study concludes that external scattering layers can enhance the EQE of lab scale OLEDs, but caution is required when transferring these conclusions to large area applications due to the significant contribution of areas outside the active area. It proposes the investigation of brightness profiles in addition to standard EQE characterizations for more reliable predictions.
研究不足
The study highlights the discrepancy between efficiency enhancements observed in lab scale OLEDs and their applicability to large area applications, suggesting that edge effects may lead to overestimations of efficiency improvements.
1:Experimental Design and Method Selection:
The study involves the attachment of external scattering layers to red, green, and blue lab scale OLEDs to evaluate their impact on light outcoupling efficiency.
2:Sample Selection and Data Sources:
Lab scale OLEDs with active areas of approximately
3:5 mm × 5 mm and larger OLEDs with active areas of approximately 2 cm × 2 cm were used. List of Experimental Equipment and Materials:
Scattering foils comprising TiO2 particles, integrating sphere, photodiode, goniometer, camera for brightness profile analysis.
4:Experimental Procedures and Operational Workflow:
The foils were attached to the OLEDs, and their impact on EQE and brightness was measured using various techniques including integrating sphere, photodiode, goniometer, and camera imaging.
5:Data Analysis Methods:
The data was analyzed to compare the efficiency enhancements observed with different measurement methods and to evaluate the contribution of areas outside the active area to the measured EQE.
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Integrating sphere
LMS-100
Labsphere Inc.
Used for measuring the EQE of OLEDs.
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Photodiode
SM1PD1A
Thorlabs
Used for measuring the forward emission of OLEDs.
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Camera
Basler acA1920-40uc
Basler
Used for taking images of OLEDs to analyze brightness profiles.
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Extension tube
RICOH 20 mm
RICOH
Used with the camera and lens for imaging OLEDs.
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Laser
STAR405F10
Roithner Lasertechnik
Used for measuring the 360° angle dependent scattering of the foils.
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Source-measuring unit
Keithley 2450
Keithley
Used for reading out the photodiode current.
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NOA63
Norland Products Inc.
Optical adhesive used in the fabrication of scattering foils.
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TiO2 nanoparticles
50 nm diameter
mkNANO
Scattering particles embedded in the NOA63 adhesive to create light scattering foils.
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ZrO2 particles
NETZSCH-Feinmahltechnik GmbH
Used for milling clustered TiO2 nanoparticles to prevent cluster formation.
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Goniometer
Home-built
Used for measuring the angular dependent radiant intensity of OLEDs.
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Lens
Fujifilm Fujinon HF25XA-1
Fujifilm
Used with the camera for imaging OLEDs.
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