研究目的
Investigating the effect of short-term thermal stresses in CdTe thin film solar cells to understand the degradation mechanisms.
研究成果
The study identified a decrease in cell efficiency, a drop in carrier lifetime, and changes in electrical parameters due to short-term thermal stress. Degradation is preliminarily ascribed to the diffusion of Cu or O2 towards the active region of the device, influencing both optical and electric characteristics.
研究不足
The study focuses on short-term thermal stress effects and may not fully represent long-term degradation mechanisms. The specific conditions of the stress test may not cover all real-world operating conditions.
1：Experimental Design and Method Selection:
The study involved submitting CdTe solar cell samples to accelerated thermal stress tests to emulate short-term use conditions. Various characterization techniques were employed to monitor degradation.
2：Sample Selection and Data Sources:
CdTe solar cells fabricated on soda lime glass in superstrate configuration were used.
3：List of Experimental Equipment and Materials:
Equipment included the LOANA system for EQE measurements, Keithley 2651A source meter for dark and light IV measurements, a LEDs solar simulator, and a Tektronix DPO 7354 oscilloscope for PVD measurements. A climatic chamber (MPM instrument M400-VF) was used for thermal stress.
4：Experimental Procedures and Operational Workflow:
The stress test involved controlled heating and cooling steps, with measurements taken at the end of each step.
5：Data Analysis Methods:
Data from EQE, dark IV, light IV, and PVD measurements were analyzed to study degradation effects.
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