研究目的
Investigating the optical properties of binary GaAs, ZnTe, CdTe and ternary Cd1-xZnxTe (CZT) alloys in the far-infrared (FIR) and near-infrared (NIR) to ultraviolet (UV) regions to understand their polarization dependent reflectivity and transmission spectra.
研究成果
The study successfully established accurate model dielectric functions for binary and ternary alloys, which were used to evaluate the polarization dependent reflectivity and transmission spectra of ultrathin CZT/GaAs (001) epifilms. The methodology offers a credible testimony for characterizing epitaxially grown nanostructured films of technological importance.
研究不足
The study is limited by the spectral range of the instruments used and the quality of the samples. The theoretical models may not fully capture all the complexities of the experimental data.
1：Experimental Design and Method Selection:
A high resolution Fourier transform infrared spectrometer was used to assess the FIR response of GaAs, ZnTe, CdTe and CZT alloys. Model dielectric functions were established to extort the optical constants of the binary materials.
2：Sample Selection and Data Sources:
The samples were grown using the Bridgman technique and characterized by FIR reflectivity and transmission measurements.
3：List of Experimental Equipment and Materials:
Bruker IFS66 spectrometer with KBr beam-splitter and a deuterated triglycine sulfate (DTGS) detector.
4：Experimental Procedures and Operational Workflow:
The FIR reflectance spectra were measured at near normal incidence and analyzed theoretically by using a classical 'Drude-Lorentz' methodology.
5：Data Analysis Methods:
The experimental data was analyzed using a Levenberg-Marquardt algorithm for non-linear simulations to minimize the error function.
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