研究目的
To study nickel nanoclusters grown inside single-walled carbon nanotubes using infrared scattering-type scanning near-field optical microscopy (s-SNOM) and to establish the sensitivity of the method.
研究成果
The study demonstrated that near-field optical microscopy is very sensitive to the presence of metallic phases inside carbon nanotubes, allowing the detection of nickel clusters containing fewer than 700 atoms. The modified finite dipole model reliably predicted the optical signal of nanoparticles.
研究不足
The study is limited by the spatial resolution of the s-SNOM technique and the sensitivity of the method to detect very small nickel clusters inside carbon nanotubes.
1：Experimental Design and Method Selection:
The study used infrared scattering-type scanning near-field optical microscopy (s-SNOM) to image nano-sized nickel atom clusters inside single-walled carbon nanotubes based on their infrared optical response. The experimental results were supported by calculations using the finite dipole model.
2：Sample Selection and Data Sources:
The samples were nickel nanoclusters grown inside single-walled carbon nanotubes, prepared by annealing nickelocene encapsulated in SWCNTs.
3：List of Experimental Equipment and Materials:
The s-SNOM setup (Neaspec GmbH) based on an atomic force microscope with a metal-coated tip illuminated by a focused laser beam (infrared quantum cascade laser). Magnetic force microscopy (MFM) was performed with a Bruker Dimension Icon AFM instrument.
4：Experimental Procedures and Operational Workflow:
The samples were annealed at 700°C for 2 hours to create nickel clusters. The near-field microscopy was performed on samples deposited on a silicon substrate by vacuum filtration.
5：Data Analysis Methods:
The near-field signal was demodulated at the higher harmonics of the tip oscillation frequency and analyzed using pseudo-heterodyne detection based on a Michelson-type interferometer.
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