研究目的
Measurement of the uniaxial anisotropic dielectric constant of different planar samples by means of a single sensor.
研究成果
A new approach in the measurement of the uniaxial dielectric constant anisotropic has been tested. The method is based on a sensor in microstrip technology, formed by coupled resonators, which have odd and even propagation modes. Each mode has a different electric field configuration, suitable for determining the parallel and perpendicular dielectric constant of a sample placed on the sensor. With this sensor, it is possible the anisotropic dielectric constant of the SUT to extract without having to print resonators on the SUT. The method is fast and inexpensive because a single sensor allows several samples to be characterized.
研究不足
The method is suitable for the characterization of samples with thickness greater than 10 mil (0.254 mm), since thinner samples fall in a region of strong electric field, increasing the uncertainty of measurement because increasing sensitivity to imperfections on the surface of the SUT and SUT placement errors.
1：Experimental Design and Method Selection:
The sensor is based on a couple of straight-line coupled resonators in microstrip technology that can be excited in odd and even propagation modes.
2：Sample Selection and Data Sources:
Samples of anisotropic dielectrics (FR4, Rogers 4350B, and Arlon Diclad 880), and the isotropic material PTFE.
3：List of Experimental Equipment and Materials:
RT/duroid 5880 substrates of Rogers Corporation, with εr of
4：2 ± 02, loss tangent of 0009, copper cladding thickness t of 18 μm, and a dielectric thickness h of 79 mm. Experimental Procedures and Operational Workflow:
The sensor is designed on an isotropic substrate at the design frequency. Due to the electric field configuration specific for each mode, it is possible to relate these modes to the dielectric constant in two different directions (parallel and perpendicular) of a dielectric material placed on top of the sensor.
5：Data Analysis Methods:
The resonant frequency of an open-ended microstrip resonator can be calculated by (1), where εr is the dielectric constant of the substrate, c is the speed of light in vacuum, l is the physical length of the resonator, and n the order of resonance.
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