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A “Positive Incentive” Approach to Enhance Operational Stability of Quantum Dot based Light-Emitting Diode

DOI:10.1021/acsami.9b13217 期刊:ACS Applied Materials & Interfaces 出版年份:2019 更新时间:2025-09-16 10:30:52
摘要: Balanced charge injection promises high efficiency of quantum dot based light-emitting diodes (QD-LEDs). Most widely used approach to realize charge injection balance is impeding the injection rate of the dominant charge carrier with energetic barriers. However, these approaches often accompany unwanted outcomes (e.g., the increase in operation voltage) that sacrifice the operation stability of devices. Herein, a “positive incentive” approach is proposed to enhance the efficiency and the operational stability of QD-LEDs. Specifically, the supply of hole, an inferior carrier than its counterpart, is facilitated by adopting a thin fullerene (C60) interlayer at the interface between hole injection layer (MoOX) and hole transport layer (CBP). The C60 interlayer boosts the hole current by eliminating the universal energy barrier, lowers the operation voltage of QD-LEDs, and enhances the charge balance in the QD emissive layer within working device. Consequently, QD-LEDs benefitting from the adoption of C60 interlayer exhibit significantly enhanced device efficiency and operation stability. Grounded on the quantitative assessment of the charge injection imbalance within the QD emissive layer, the impact of electrical parameters of QD-LEDs to their optoelectronic performance and operational stability is also discussed.
作者: Seunghyun Rhee,Jun Hyuk Chang,Donghyo Hahm,Kyunghwan Kim,Byeong Guk Jeong,Hak June Lee,Jaehoon Lim,Kookheon Char,Changhee Lee,Wan Ki Bae
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To enhance the operational stability of quantum dot based light-emitting diodes (QD-LEDs) by facilitating the supply of holes through the insertion of a thin fullerene (C60) interlayer, thereby improving charge injection balance and reducing operation voltage.

The insertion of a thin C60 interlayer at the interface between organic HTL and MoOX//Al enhances the hole current, lowers the operation voltage, and improves the charge balance in QD-LEDs, leading to significantly enhanced device efficiency and operational stability. The study highlights the importance of charge injection balance and operation voltage in device degradation.

The enhancement of charge injection balance in the QD emissive layer is limited by the energy barrier for hole injection at the interface between HTL and QDs. The study suggests that further engineering at this interface is necessary for complete charge balance.

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