研究目的
Investigating the surface plasmon effects of Ag nanoparticles depending on substrate temperature and coating time, and their application in solar cells.
研究成果
Homogeneous nano-sized Ag particles can be obtained at 150–200 K, showing plasmon resonance effect around 435–540 nm. Ag nanoparticles prepared at low substrate temperature increased solar cell efficiency, while those at high temperature decreased efficiency with increasing coating time. Optimal plasmonic effect is achieved for a critical particle size-thickness ratio.
研究不足
The study focuses on the effects of substrate temperature and coating time on Ag nanoparticles' plasmonic effects and solar cell efficiency, but does not explore other potential variables or materials.
1:Experimental Design and Method Selection:
Vacuum deposition at low substrate temperature (< 300 K) was used for Ag coating.
2:Sample Selection and Data Sources:
Ag thin films were deposited on n-type Si, glass, and solar cell with safety glass substrates.
3:List of Experimental Equipment and Materials:
Rigaku Smartlab with CuKα radiation for XRD, Jeol JSM 6610 for SEM, Zeiss Sigma 300 FE-SEM for surface morphology, Bruker DektakXT profilometer for thickness, SpectraMax M5 spectrophotometer and J.A. Woollam VB-400 VASE spectroscopic ellipsometer for optical measurements, Dongwoo Optron device for photocurrent characteristics, Keithley 2410 source meter for I-V measurement.
4:Experimental Procedures and Operational Workflow:
Substrates were cooled by liquid nitrogen, Ag was deposited at various temperatures and coating times, structural and optical characteristics were analyzed.
5:Data Analysis Methods:
XRD and SEM for structural and morphological properties, optical transmittance and reflectance spectra for optical properties, photocurrent and I-V measurements for solar cell efficiency.
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Rigaku Smartlab
CuKα radiation (λ = 1.5408 ?)
Rigaku
X-ray diffraction studies
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Jeol JSM 6610
Jeol
Scanning electron microscope studies
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Zeiss Sigma 300
Zeiss
Field emission scanning electron microscope for surface morphology
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Bruker DektakXT
Bruker
Profilometer for thickness determination
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SpectraMax M5
Spectrophotometer for optical transmittance and reflectance spectra
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J.A. Woollam VB-400 VASE
J.A. Woollam
Spectroscopic ellipsometer for optical measurements
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Dongwoo Optron
Dongwoo Optron
Device for photocurrent characteristics
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Keithley 2410
Keithley
Source meter for I-V measurement
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Sciencetech Inc. solar simulator
Sciencetech Inc.
Solar simulator for standard conditions
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