研究目的
Investigating the thermal stability of self-assembled hybrid Au?BaTiO3 (BTO) thin films for high-temperature plasmonic applications.
研究成果
The Au?BaTiO3 hybrid thin film exhibits excellent thermal stability and maintains its optical properties after extensive high-temperature annealing, making it suitable for high-temperature plasmonic applications.
研究不足
The study is limited to the thermal stability of Au?BaTiO3 hybrid thin films up to 600 °C for extended periods and 750 °C for short periods. The in situ TEM heating experiment was limited to 650 °C to avoid glue evaporation.
1：Experimental Design and Method Selection:
The study involved ex situ annealing followed by TEM analysis and an in situ heating study in TEM to investigate the thermal stability of the Au?BaTiO3 nanocomposite thin film.
2：Sample Selection and Data Sources:
The Au?BTO thin films were deposited on single-crystalline SrTiO3 (STO) (001) substrates using the PLD system.
3：List of Experimental Equipment and Materials:
A KrF excimer laser (Lambda Physik Compex Pro 205, λ = 248 nm), X-ray diffractometer (Panalytical X’Pert), TEM and STEM (FEI Talos 200X system), UV?vis?NIR absorption spectrophotometer (PerkinElmer Lambda 1050), spectroscopic ellipsometer (J.A. Woollam RC2), and Raman microscope (Renishaw RM 2000).
4：0). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The films were annealed at 600 °C for different time periods, followed by optical and microstructural characterization.
5：Data Analysis Methods:
XRD, TEM, STEM, optical measurements, and Raman spectroscopy were used to analyze the crystallinity, microstructure, and optical properties of the films.
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X-ray diffractometer
X’Pert
Panalytical
Used to characterize the crystallinity of the thin film.
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TEM and STEM
Talos 200X
FEI
Used for transmission electron microscopy and scanning transmission electron microscopy analysis.
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UV?vis?NIR absorption spectrophotometer
Lambda 1050
PerkinElmer
Used for normal incident transmittance and reflectance spectra collection.
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Spectroscopic ellipsometer
RC2
J.A. Woollam
Used for ellipsometry measurements.
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KrF excimer laser
Compex Pro 205
Lambda Physik
Used for pulsed laser deposition (PLD) of the Au?BaTiO3 nanocomposite thin film.
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Raman microscope
RM 2000
Renishaw
Used for Raman spectroscopy measurements.
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