研究目的
To examine how frost stress manifests as changes in spectral reflectance of wheat plant components over time, under controlled conditions.
研究成果
The study demonstrated that changes in spectral reflectance due to frost stress could be detected from 1 to 5 days after frost using hyperspectral imaging. Significant differences were found between treatments over time in several regions of the EMS, providing potential avenues for future research and sensor selection for frost damage identification.
研究不足
The study was conducted under controlled conditions, which may not fully replicate field conditions. The spectral response observed may vary under natural frost conditions.
1:Experimental Design and Method Selection:
The study used hyperspectral profiling under controlled conditions to examine the effect of imposed frost stress on the spectral response of wheat plant components.
2:Sample Selection and Data Sources:
Wheat plants (Triticum aestivum L. cv. Wyalkatchem) were grown in pots in a glasshouse and subjected to controlled freezing conditions.
3:List of Experimental Equipment and Materials:
Hyperspectral linescanner (Pika IIi, Resonon Inc.), LED light bulbs, Spectralon for white reflectance calibration.
4:Experimental Procedures and Operational Workflow:
Plants were imaged at days after frost (DAF) 1, 3, and
5:Hyperspectral images were captured in a darkroom. Data Analysis Methods:
Data extraction and analysis involved thresholding NDVI values, calculating mean reflectance per band, and using a repeated measures linear mixed model for significance testing.
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