研究目的
Investigating the control of unique atomic-layer constructions and oxygen-dependent multivalent states in layered nonstoichiometric V7O16 thin films for applications in energy conversion, storage, chemical catalysis, sensors, and optoelectronic devices.
研究成果
The study successfully demonstrated the control of oxygen-dependent multivalent states and crystalline phases in layered nonstoichiometric V7O16 thin films using ALD and post-annealing. The films showed no abrupt electronic and structural transitions from 78 to 475 K, indicating potential for applications in electrochemical devices and layered oxides.
研究不足
The study focuses on the control of oxygen content and film thickness for the formation of V7O16, but the effects of other parameters like annealing temperature and time are not fully explored. The surface oxidation effect in air ambient may lead to higher V5+ content than expected.
1:Experimental Design and Method Selection:
The V7O16 thin films were prepared using atomic layer deposition (ALD) followed by a post-annealing crystallization process. The ALD process utilized VO(OC3H7)3 and deionized water as precursors.
2:Sample Selection and Data Sources:
Silicon and sapphire substrates were pre-cleaned and used for the deposition of VOx thin films.
3:List of Experimental Equipment and Materials:
ALD reactor, X-ray diffractometer (Bruker D8), Raman spectrometer (Nanofinder 30), scanning electron microscopy (FEI Sirion200), transmission electron microscopy, X-ray photoelectron spectrometer (K-Alpha, Thermo Scientific), cryogenic probe station (Lakeshore TTPX), and Lambda 950 spectrophotometer.
4:Experimental Procedures and Operational Workflow:
The substrates were cleaned, an Al2O3 buffer layer was deposited, VOx thin films were grown, and then annealed under controlled oxygen pressure to form V7O
5:Data Analysis Methods:
XRD, Raman spectroscopy, XPS, SEM, TEM, and electrical and optical measurements were used to analyze the films.
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X-ray diffractometer
Bruker D8
Bruker Corporation
Analyzing the crystal structure of V7O16
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Raman spectrometer
Nanofinder 30
TII Tokyo Instruments, Inc.
Conducting Raman mappings and measuring Raman spectra
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Scanning electron microscopy
FEI Sirion200
FEI
Investigating morphologies and crystalline structures of V7O16 thin films
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X-ray photoelectron spectrometer
K-Alpha
Thermo Scientific
Measuring XPS spectra
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Cryogenic probe station
Lakeshore TTPX
Lakeshore
Measuring resistance characteristics of V7O16 thin films
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Spectrophotometer
Lambda 950
PerkinElmer
Recording temperature-dependent transmission spectra
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