研究目的
Investigating the effect of selenium partial pressure on the performance of Cu2ZnSn(S,Se)4 (CZTSSe) solar cells.
研究成果
An optimal partial pressure of 22542 Pa was obtained when the quartz tube length was 30 cm and the temperature was 580°C, leading to a CZTSSe thin-film solar cell with a maximum efficiency of 3.27%. The study provides an appropriate selenium partial pressure condition for the preparation of CZTSSe solar cells.
研究不足
The study is limited by the inability to accurately control the change of partial pressure of selenium in the selenization process, depending on the dosage of selenium source and the regulation of selenization temperature.
1：Experimental Design and Method Selection:
CZTS precursor films were fabricated by RF magnetron sputtering with ZnS, Sn, and Cu targets, followed by selenization in quartz tubes of different lengths.
2：Sample Selection and Data Sources:
Soda-lime glass was used as a substrate for CZTSSe solar cells.
3：List of Experimental Equipment and Materials:
RF magnetron sputtering system, quartz tubes, Se particles, X-ray diffraction (XRD), field emission scanning electron microscope (FE-SEM), Energy-Dispersive Spectrometer (EDS), Raman spectroscopy, UV–vis–NIR spectroscopy.
4：Experimental Procedures and Operational Workflow:
Precursor films and Se particles were placed in quartz tubes of different lengths for selenization at 580°C.
5：Data Analysis Methods:
XRD, FE-SEM, EDS, Raman spectroscopy, and UV–vis–NIR spectroscopy were used to analyze the structure, composition, and optical properties of the films.
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X-ray diffraction
Rigaku Ultima IV
Rigaku
Used to examine the crystal structure of the CZTS films.
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Field emission scanning electron microscope
Zeiss SUPRA 55 VP
Zeiss
Used to characterize the morphology of the thin films.
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Energy-Dispersive Spectrometer
Oxford instrument X-MaxN
Oxford
Used to estimate the composition of the CZTSSe absorber layers.
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Keithley 2400 source meter unit
2400
Keithley
Used to measure current–voltage characteristics under a simulated air mass 1.5 global spectrum.
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RF magnetron sputtering system
Used for depositing precursor films.
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Raman spectroscopy
Used for Raman spectroscopy measurements.
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UV–vis–NIR spectroscopy
UV-3600
Used to estimate the optical bandgap energy of the film.
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