研究目的
Investigating the sensitivity of L-band radiometry to thin sea ice thickness (SIT) and validating state-of-the-art satellite SIT products against in-situ data.
研究成果
The study demonstrates that L-band radiometry can effectively retrieve sea ice thickness up to 0.6 m, with signal saturation beginning at 0.3 m. The CFDD model shows good correlation with in-situ ULS data during the sea ice growth season, highlighting its utility as a proxy for ground truth. The quality of L-band SIT retrievals is significantly influenced by sea ice concentration and season, with optimal conditions during the freeze-up period.
研究不足
The study is limited by the spatial and temporal coverage of in-situ ULS data, which, although comprehensive, are spatially limited to the Beaufort Sea. The validation is also constrained by the representativeness of the in-situ data at the satellite resolution scale, especially for late winter and spring months.
1:Experimental Design and Method Selection:
The study utilizes L-band brightness temperature measurements from SMOS and SMAP missions to assess their sensitivity to thin sea ice thickness. Theoretical and empirical retrieval methods are employed to estimate SIT.
2:Sample Selection and Data Sources:
In-situ SIT datasets from Upward Looking Sonar (ULS) data provided by the Woods Hole Oceanographic Institution (WHOI) are used for validation. Ancillary data include sea ice concentration (SIC) maps, sea ice drift data, and surface air temperatures.
3:List of Experimental Equipment and Materials:
SMOS and SMAP satellite data, ULS data, SIC maps from OSI SAF, sea ice drift data from NASA NSIDC, and NCEP/NCAR Reanalysis surface air temperatures.
4:Experimental Procedures and Operational Workflow:
The study involves processing SMOS and SMAP data, comparing satellite-derived SIT with ULS ground truth, and using the CFDD model to extend the validation dataset.
5:Data Analysis Methods:
Statistical analysis is performed to compare satellite SIT products with in-situ data and model outputs, focusing on the relationship between L-band brightness temperature and SIT.
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