研究目的
Investigating the effect of horizontal p-n junction on optoelectronics characteristics in InGaN-based light-emitting diodes with V-shaped pits.
研究成果
The horizontal p-n junction in InGaN-based LEDs with large V-shaped pits creates a strong horizontal built-in electric field, effectively separating photogenerated carriers and changing the turn-on order of QWs, which reduces the operating voltage. This suggests a new approach for analyzing and designing InGaN-based LEDs with V-shaped pits.
研究不足
The study focuses on the changes in optoelectronics features from a perspective of changes in geometric shapes of p-n junctions caused by V-shaped pits, avoiding discussion on non-radiative recombination rate at dislocations and quantum efficiency.
1:Experimental Design and Method Selection:
Two InGaN-based LEDs with and without pre-layer were prepared to study the effect of horizontal p-n junction on optoelectronics characteristics.
2:Sample Selection and Data Sources:
Samples were characterized using secondary ion mass spectrometry (SIMS), scanning transmission electron microscope (STEM), and scanning electron microscope (SEM).
3:List of Experimental Equipment and Materials:
SIMS (CAMECA IMS-7F), STEM (Tecnai G2 F20), SEM (Hitachi SU8100), laser with a wavelength of 380 nm for PL tests, DC power supply (Keithley 2635), and spectrometer (Instrument Systems CAS140CT) with an integrating sphere (Instrument Systems ISP250-211) for EL and ??-?? tests.
4:Experimental Procedures and Operational Workflow:
The epi-growth was carried out on Si(111) substrate using a Thomas Swan closed-coupled showerhead metal-organic chemical vapor deposition reactor.
5:Data Analysis Methods:
The influence of the horizontal p-n junction was analyzed through PL, EL, and ??-?? measurements.
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DC power supply
2635
Keithley
Used for electroluminescence (EL) and ??-?? tests.
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spectrometer
CAS140CT
Instrument Systems
Used for electroluminescence (EL) and ??-?? tests.
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integrating sphere
ISP250-211
Instrument Systems
Used for electroluminescence (EL) and ??-?? tests.
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scanning electron microscope
SU8100
Hitachi
Characterization of the surface morphologies of MQWs.
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secondary ion mass spectrometry
IMS-7F
CAMECA
Measurement of depth and composition profiles of the LEDs.
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scanning transmission electron microscope
Tecnai G2 F20
Characterization of the cross-sections of the active regions.
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