研究目的
To investigate the morphological characteristics of surface nanostructures in lithium borate crystals and glasses, a strontium borate crystal, lanthanide containing borate crystals, and aluminate silicate crystals using single-shot femtosecond laser ablation experiments with linearly and circularly polarized light.
研究成果
The study concludes that the morphology of nanoholes induced by single-shot femtosecond laser ablation is material-dependent, with anisotropic quadrilateral morphologies observed in LTB and LBO crystals and isotropic circular morphologies in other borate and aluminate silicate crystals and glasses. The formation of secondary nanoholes is attributed to a spontaneous reshaping of the incoming Gaussian pulse into a Gaussian–Bessel pulse.
研究不足
The study focuses on the morphological characteristics of nanoholes induced by single-shot femtosecond laser ablation in specific borate and aluminate silicate crystals and glasses. The findings may not be generalizable to other materials or under different ablation conditions.
1:Experimental Design and Method Selection:
Single-shot femtosecond laser ablation experiments were conducted with linearly and circularly polarized light to investigate the morphological characteristics of surface nanostructures.
2:Sample Selection and Data Sources:
Samples included lithium borate crystals and glasses, a strontium borate crystal, lanthanide containing borate crystals, and aluminate silicate crystals.
3:List of Experimental Equipment and Materials:
A regenerative amplified Ti:sapphire laser (pulse duration: 150 fs, repetition rates: 1 kHz and 200 kHz) operating at a peak wavelength of 800 nm was used.
4:Experimental Procedures and Operational Workflow:
Linear and circular laser beams were focused with ×100 and NA (numerical aperture) =
5:9 for 1 kHz microscope objective onto the surface of the sample on a XYZ translation stage at normal incidence. Data Analysis Methods:
The morphology of the ablated holes was observed using field-emission scanning electron microscopy (FE-SEM) and focused ion beam scanning electron microscopy (FIB-SEM).
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