研究目的
To demonstrate how in-line holography in TEM enables the study of radiation-sensitive nanoparticles of organic and inorganic materials, providing high-contrast holograms of single nanoparticles with low electron current density.
研究成果
In-line holography in TEM provides a powerful method for true single-particle atomic resolution imaging of radiation-sensitive nanoparticles, opening new perspectives for the study of soft matter in biology and materials science.
研究不足
The method requires careful control of electron current density to avoid radiation damage. The study is limited to specimens that can withstand the vacuum conditions of TEM.
1：Experimental Design and Method Selection:
In-line holography in TEM was used to study radiation-sensitive nanoparticles. The method involves illuminating specimens with a low density of electron current to minimize damage while providing high-contrast holograms.
2：Sample Selection and Data Sources:
Nanoparticles of organic and inorganic materials were studied. Specimens were prepared by dispersing pristine powders on a copper grid covered by an amorphous carbon film.
3：List of Experimental Equipment and Materials:
JEOL 2010 FEG UHR TEM/STEM operated at 200 kV, equipped with a field emission cathode and an objective lens with Cs = (0.47 ± 0.01) mm.
4：47 ± 01) mm.
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The method involves using in-line holography to survey the specimen, find suitable isolated particles, and tune the experimental conditions for reliable quantitative atomic resolution imaging.
5：Data Analysis Methods:
The approach enables the acquisition of low dose and low dose rate HRTEM images from radiation-sensitive materials, gathering information similar to methodologies used in materials science.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容
