研究目的
Investigating the replacement of conventionally used CdS buffers in Cu2ZnSn(S,Se)4 (CZTSSe) based thin-film solar cells with sputtered Zn(O,S) buffer layers and a hybrid buffer layer configuration to improve device performance and reduce cadmium usage.
研究成果
The hybrid buffer configuration of a thin CdS layer followed by Zn(O,S) significantly improves the VOC and overall performance of CZTSSe-based solar cells, achieving a record low VOC deficit. This approach reduces cadmium usage while overcoming one of the main bottlenecks in kesterite solar cells. Future work could focus on further reducing cadmium usage and optimizing the band alignment.
研究不足
The study highlights the challenge of sputter damage to the absorber surface when using Zn(O,S) buffers without an intermediate CdS layer, which limits VOC. The hybrid buffer configuration, while effective, still requires a minimum CdS thickness to prevent damage, indicating a limitation in completely eliminating cadmium from the device.
1:Experimental Design and Method Selection:
The study involved the fabrication of CZTSSe-based solar cells with different buffer layers (CdS, Zn(O,S), and hybrid CdS/Zn(O,S)) to compare their performance. The Zn(O,S) layers were deposited by RF sputtering with varying [O]/([O] + [S]) ratios.
2:Sample Selection and Data Sources:
CZTSSe absorbers were prepared by doctor blading and selenization. Buffer layers were deposited on these absorbers, and the devices were completed with transparent electrodes.
3:List of Experimental Equipment and Materials:
Equipment included a rapid thermal processing furnace, RF sputtering system, and characterization tools like XPS, EQE, and IV measurement setups. Materials included Zn(O,S) targets, CdS chemical bath, and CZTSSe precursor ink.
4:Experimental Procedures and Operational Workflow:
The process involved absorber preparation, buffer layer deposition, device completion, and performance characterization through IV, EQE, XPS, and other measurements.
5:Data Analysis Methods:
Performance parameters were derived from IV curves, EQE measurements, and XPS spectra. The bandgap was determined from EQE and electroreflectance spectroscopy.
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