研究目的
Investigating the synthesis of boron-doped graphene films by pulsed laser co-deposition of carbon and boron, followed by rapid thermal annealing, to control the boron concentration and study its effects on the graphene's properties.
研究成果
The study successfully demonstrates the synthesis of boron-doped graphene films with controlled boron concentration using PLD and RTA. The BG films maintain the graphene nanoarchitecture but show increased defect density. This method offers a reproducible way to tailor the electrical and chemical properties of graphene for various applications.
研究不足
The study focuses on a relatively low boron concentration (2 at.%) and its effects on graphene properties. Higher boron concentrations and their effects, as well as the electronic and electrochemical properties of the BG films, are suggested for future investigations.
1:Experimental Design and Method Selection:
The study uses pulsed laser co-deposition (PLD) of carbon and boron in high vacuum conditions, followed by rapid thermal annealing (RTA) at 1100°C to convert the amorphous a-C:B film into boron-doped graphene (BG).
2:Sample Selection and Data Sources:
SiO2 substrates were cleaned and coated with a 60 nm thick nickel film by thermal evaporation. The a-C:B films were synthesized by PLD onto the nickel film.
3:List of Experimental Equipment and Materials:
Equipment includes a thermal evaporation system, PLD chamber with a KrF excimer laser, RTA oven, Raman spectrometer, XPS spectrometer, FEG-SEM, HRTEM, and AFM.
4:Experimental Procedures and Operational Workflow:
The process involves Ni film deposition, a-C:B film deposition by PLD, and RTA to form BG films. Characterization was performed using Raman, XPS, SEM, HRTEM, and AFM.
5:Data Analysis Methods:
Raman spectra were analyzed using Lorentzian and Breit-Wigner-Fano fits. XPS data were interpreted based on previous studies. SEM, HRTEM, and AFM images were analyzed for morphology and structure.
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