研究目的
To synthesize and characterize a novel carboxymethyl cellulose zinc thin film [ZnCMC]TF for optoelectronic device applications, and to compare the simulated results with experimental findings.
研究成果
The [ZnCMC]TF polymer was successfully synthesized and characterized, showing promising optical properties for optoelectronic applications. The simulated results closely matched the experimental findings, validating the theoretical models used.
研究不足
The study focuses on the synthesis and characterization of [ZnCMC]TF without extensive application testing in actual optoelectronic devices. The comparison between simulated and experimental results is limited to optical properties.
1:Experimental Design and Method Selection
The study employed the sol–gel technique for the fabrication of [ZnCMC]TF. Characterization techniques included FTIR, Raman spectroscopy, UV-Vis, XRD, SEM, TEM, and EDX. DFT by DMol3 and CASTEP program was used for optimization.
2:Sample Selection and Data Sources
Samples were prepared by dissolving Zn(CH3COO)2 in DI–H2O and mixing with CMC under magnetic agitation. The solutions were cast into glass Petri dishes and dried.
3:List of Experimental Equipment and Materials
PerkinElmer FTIR apparatus 1650 SP, Laser Raman spectrometer, Digital micrometer, Philips X-ray diffractometer, SHIMADZU UV-3101 UV-Vis-NIR pc, Inspect S FEI scanning electron microscopy, TEM JEOL ARM-200F.
4:Experimental Procedures and Operational Workflow
Zn(CH3COO)2 was dissolved in DI–H2O, mixed with CMC, stirred, cast into Petri dishes, dried, and peeled off for analysis.
5:Data Analysis Methods
Data analysis included FTIR and Raman spectra interpretation, XRD pattern analysis, SEM and TEM image analysis, and optical properties measurement.
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Laser Raman spectrometer
DXR
Thermo Fisher
Used for Raman spectroscopy analysis.
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SHIMADZU UV-3101 UV-Vis-NIR pc
UV-3101
SHIMADZU
Used for ultraviolet–visible spectroscopy analysis.
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Inspect S FEI scanning electron microscopy
Inspect S
FEI
Used for scanning electron microscopy analysis.
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TEM JEOL ARM-200F
ARM-200F
JEOL
Used for transmission electron microscopy analysis.
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PerkinElmer FTIR apparatus
1650 SP
PerkinElmer
Used for Fourier-transform infrared spectroscopy analysis.
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Digital micrometer
Used for measuring film thickness.
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Philips X-ray diffractometer
X’pert
Philips
Used for X-ray diffraction analysis.
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