研究目的
To present two silicon-micromachined narrowband 4th order waveguide filter concepts with a center frequency of 450 GHz, achieving a fractional bandwidth as low as 1% and high unloaded quality factors.
研究成果
The presented narrowband waveguide filters at 450 GHz with 1% fractional bandwidth demonstrate the best combination of fractional bandwidth and measured insertion losses in passband, along with the highest reported unloaded quality factors for submillimeter-wave filters in any technology.
研究不足
The filters exhibited a slight frequency shift from the simulated data due to underetching and minor assembly inaccuracies, affecting the return loss detuning.
1:Experimental Design and Method Selection:
The filters were designed using CST Microwave StudioTM for initial cavity sizing and coupling coefficient tuning. The entire filter structures were simulated, and their coupling matrices were extracted using a vector fitting algorithm embedded in CST Filter Designer 3D tool.
2:Sample Selection and Data Sources:
Prototype devices were fabricated on silicon-on-insulator (SOI) wafers using a two-mask micromachining process.
3:List of Experimental Equipment and Materials:
Applied-Materials Centura tool for deep-reactive ion etching (DRIE), Rohde&Schwarz ZVA24 vector network analyzer with WM-570 millimeter-wave converters for characterization.
4:Experimental Procedures and Operational Workflow:
The chips were metallized by sputtering a 1-μm thick layer of gold, assembled into a three-layer stacked configuration, and bonded using thermo-compression bonding.
5:Data Analysis Methods:
The unloaded quality factors of the resonators were extracted from the measurement results.
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