研究目的
Developing methods for traceable characterization and uncertainty evaluation of planar 1-port CPW short-open-load (SOL) devices.
研究成果
Parameterization models and an EM-simulation based characterization approach for CPW-based SOL devices have been successfully developed. The first results of a comparison between these models and measurement experiments show considerable agreement and form the basis for future work.
研究不足
Nonconformity for some results might be caused by incorrect exclusion of certain uncertainty contributions, such as probe repeatability and frequency dependent conductivity of the used materials. For the highest frequencies, the omission of the coupling between the two on-wafer probes likely plays a role as well.
