研究目的
To realize a microwave strength measurement at an arbitrary frequency within the full X-band of 8.2–12.4 GHz using cesium atoms by adjusting the resonant frequency based on the Zeeman effect.
研究成果
The experiments confirmed that the resonant frequency of cesium atoms can be shifted within the X-band by applying a DC magnetic field, demonstrating the feasibility of atomic measurements of microwave strength at arbitrary frequencies within this band. This lays the groundwork for future development of atomic microwave measurements.
研究不足
The measurements using atomic resonance are limited to the resonance frequency with atoms, requiring the application of a DC magnetic field to adjust the resonant frequency for arbitrary frequencies within the X-band.
1：Experimental Design and Method Selection:
The experiment involved double-resonance spectroscopy of cesium atoms in a DC magnetic field to observe the shift in resonant frequency due to the Zeeman effect.
2：Sample Selection and Data Sources:
Gaseous cesium atoms enclosed in a glass cell inserted in a WR-90 rectangular waveguide were used.
3：List of Experimental Equipment and Materials:
A signal synthesizer for microwave generation, an external cavity diode laser for laser generation, a photo-diode for detection, and a pair of permanent magnets for applying DC magnetic fields.
4：Experimental Procedures and Operational Workflow:
Simultaneous irradiation of cesium atoms with a microwave and a laser to achieve double-resonance spectroscopy. The microwave frequency was varied within the full X-band, and the laser wavelength was fixed to the D2 line of cesium. The transmitted laser intensity was detected to observe resonance dips.
5：Data Analysis Methods:
The shifts in resonant frequencies were analyzed based on the Zeeman effect, with the magnetic flux density and the resulting frequency shifts being the primary data points.
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