研究目的
The development of a methodology for predicting the reliability of RFID passive tag power supply systems based on RTDs under given operating conditions.
研究成果
The developed methodology allows for the prediction of RFID passive tag power supply system reliability by calculating the time to failure based on RTD degradation under specified operating conditions. It can be integrated into CAD systems for designing RFID systems with passive UHF and SHF tags.
研究不足
The methodology does not account for sudden failures of other rectenna elements, focusing only on gradual failures due to RTD degradation. The failure criterion is based on the reduction of the RFID system range below a critical value, which may not cover all possible failure modes.
1：Experimental Design and Method Selection:
The methodology involves the calculation of the RFID system range as a function of time under specified operating conditions, using models for RTD degradation and RFID system performance.
2：Sample Selection and Data Sources:
The study uses theoretical models and parameters from existing literature on RTDs and RFID systems.
3：List of Experimental Equipment and Materials:
Not explicitly mentioned.
4：Experimental Procedures and Operational Workflow:
The methodology includes calculating the initial RFID system range, defining operation temperature, incrementing operation time, recalculating RTD IV-curves and RFID system range, and comparing with failure criteria.
5：Data Analysis Methods:
The analysis is based on mathematical models of RTD degradation and RFID system performance.
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