研究目的
Investigating the fine structure of semiconductor nanowires down to single atom detection and its correlation to their physical properties.
研究成果
The study demonstrates how precise knowledge of atomic positions in nanowires can enhance understanding of their physical properties, with implications for electronic and optoelectronic devices.
1:Experimental Design and Method Selection:
Utilizes scanning transmission electron microscopy (STEM) to obtain precise 3D atomic models for simulation of physical properties.
2:Sample Selection and Data Sources:
Complex nanowire heterostructures are studied, with a focus on atomic positions and single atom detection.
3:List of Experimental Equipment and Materials:
STEM and HRTEM images are used for analysis.
4:Experimental Procedures and Operational Workflow:
Includes obtaining STEM images, creating 3D atomic models, and cross-correlating theoretical properties with experimental measurements.
5:Data Analysis Methods:
Simulation of physical properties based on 3D atomic models and comparison with experimental data.
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