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High-performance black phosphorus field-effect transistors with long-term air-stability

DOI:10.1021/acs.nanolett.8b03940 期刊:Nano Letters 出版年份:2018 更新时间:2025-09-10 09:29:36
摘要: Two-dimensional layered materials (2DLMs) are of considerable interest for high-performance electronic devices for their unique electronic properties and atomically thin geometry. However, the atomically thin geometry makes their electronic properties highly susceptible to the environment changes. In particular, some 2DLMs (e.g., black phosphorus (BP) and SnSe2) are unstable and could rapidly degrade over time when exposed to ambient conditions. Therefore, the development of proper passivation schemes that can preserve the intrinsic properties and enhance their lifetime represents a key challenge for these atomically thin electronic materials. Herein we introduce a simple, non-disruptive and scalable van der Waals passivation approach by using organic thin films to simultaneously improve the performance and air stability of BP field-effect transistors (FETs). We show that dioctylbenzothienobenzothiophene (C8-BTBT) thin films can be readily deposited on BP via van der Waals epitaxy approach to protect BP against oxidation in ambient conditions over 20 days. Importantly, the non-covalent van der Waals interface between C8-BTBT and BP effectively preserves the intrinsic properties of BP, allowing us to demonstrate high-performance BP FETs with a record-high current density of 920 μA/um, hole drift velocity over 1 ⅹ 107 cm/s, and on/off ratio of 104~107 at room temperature. This approach is generally applicable to other unstable two-dimensional (2D) materials, defining a unique pathway to modulate their electronic properties and realize high-performance devices through hybrid heterojunctions.
作者: Daowei He,Yiliu Wang,Yu Huang,Yi Shi,Xinran Wang,Xiangfeng Duan
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To develop a simple, non-disruptive and scalable van der Waals passivation approach to improve the performance and air stability of BP field-effect transistors (FETs).

The van der Waals epitaxial growth of C8-BTBT thin films provides an effective approach to BP passivation, leading to high current density, high on-off ratio, and long-term environmental stability. This method is applicable to other unstable 2D materials, offering a pathway to explore their intrinsic properties and engineer interfacial modulation.

The passivation effectiveness is limited by the potential existence of cracks in the C8-BTBT thin film, which may lead to oxidation after approximately 20 days. The study also notes the challenge of achieving scalability with some passivation methods.

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