研究目的
Investigating the electrical properties of ZnO/ZnMgO core-multishell nanowire heterostructures using scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM).
研究成果
The study successfully demonstrated the high capability of SCM and SSRM as supplementary and effective tools for probing local electrical properties within functional complex quasi-1D heterostructures. Distinct contrast was obtained in both SCM and SSRM measurements, revealing a higher carrier density and a lower resistance relating to ZnO compared with neighboring ZnMgO.
研究不足
The study faced challenges in achieving reliable quantitative analysis on carrier mobility due to the thinness of the grown layers and the absence of a beveled surface. Additionally, the spatial resolution in SSRM imaging was primarily determined by the effective radius of the tip-sample contact, which could be significantly smaller than that of the tip.
1：Experimental Design and Method Selection:
The study employed SCM and SSRM techniques to investigate the electrical properties of ZnO/ZnMgO core-multishell nanowire heterostructures.
2：Sample Selection and Data Sources:
The samples were coaxially periodic ZnO/ZnMgO core-multishell nanowire heterostructures grown via a metal organic chemical vapor deposition method.
3：List of Experimental Equipment and Materials:
A scanning probe microscope (Digital Instruments Dimension 3100) with SCM/SSRM modules, Pt/Ir coated and conductive diamond (boron doped) coated Si tips.
4：Experimental Procedures and Operational Workflow:
The samples underwent a planarization process before SCM/SSRM scans. SCM and SSRM measurements were carried out in the ambient atmosphere.
5：Data Analysis Methods:
The amplitude and phase of the dC/dV signal in SCM and the resistance in SSRM were analyzed to distinguish between ZnO and ZnMgO layers.
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