研究目的
Investigating the thermal stability and structural properties of Cs doped non-IPR fullerides, specifically CsxC58, and comparing them to classic IPR fullerides like CsxC60.
研究成果
The HT-CsxC58 solid exhibits unique thermal stability due to its covalently interlinked C58 cage structure, surviving temperatures up to 1100 K where IPR fullerides decompose. Cs atoms play a minor role in stability but facilitate structural defects. The material's surface is characterized by Cs-rich islands, indicating inhomogeneous Cs distribution.
研究不足
The study is limited to the thermal stability and structural properties of CsxC58 under specific conditions. The comparison with IPR fullerides like CsxC60 provides insights but may not cover all aspects of non-IPR fullerides' behavior.
1:Experimental Design and Method Selection
The study involved co-depositing C58 cations and Cs atoms on HOPG to grow Cs doped non-IPR fullerides. The thermal stability and structural properties were investigated through heating procedures and various spectroscopic techniques.
2:Sample Selection and Data Sources
Samples were prepared by depositing Cs atoms and C58 cages onto HOPG substrates. The thickness and doping degree were controlled and monitored using XPS and UPS.
3:List of Experimental Equipment and Materials
HOPG substrate,Cs getter source,Knudsen cell,Extrel Merlin quadrupole,XPS and UPS equipment,Raman spectrometer,SPEM, AFM, and SEM for surface topography
4:Experimental Procedures and Operational Workflow
The growth of CsxC58 films involved simultaneous deposition of Cs atoms and C58 cages at room temperature, followed by thermal treatment to study stability and structural modifications. Spectroscopic analyses were performed in situ and ex situ.
5:Data Analysis Methods
Data from XPS, UPS, Raman spectroscopy, and surface topography imaging were analyzed to understand the electronic, vibrational, and structural properties of the CsxC58 materials.
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Raman spectrometer
RXN1 analyzer with NCO 1.3 optics
Kaiser Optical Systems
Monitoring vibrational properties of the solid films
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AFM
CP-II
Veeco Instruments
Ex situ surface topography imaging
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HOPG
Substrate for deposition of Cs atoms and C58 cages
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Cs getter source
SAES NF/FT-type
SAES
Source for Cs atom deposition
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Knudsen cell
Effusion of C60 fullerenes for fragmentation into C58 ions
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Extrel Merlin quadrupole
Extrel
Mass selection of C58 ions
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XPS and UPS equipment
Analysis of electronic properties and core level shifts
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SPEM
Chemical imaging and micro-spectroscopy of surface constituents
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SEM
LEO1530
LEO
Ex situ surface topography imaging
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