研究目的
To develop a Hop?eld neural network with double-layer amorphous metal-oxide semiconductor (AOS) thin-?lm devices as crosspoint-type synapse elements and validate its fundamental operation for letter recognition.
研究成果
The developed Hop?eld neural network with double-layer AOS thin-?lm devices as crosspoint-type synapse elements successfully achieves letter recognition after learning process. Scaling up the devices and circuits is expected to enable more advanced functions, compact machine size, low power consumption, and realization of various human brain functions.
研究不足
The study confirms the fundamental operation of the neuromorphic system for letter recognition but acknowledges that more advanced functions will require scaling up the devices and circuits.
1:Experimental Design and Method Selection:
The study involves the fabrication of double-layer AOS thin-?lm devices as crosspoint-type synapse elements and the assembly of a Hop?eld neural network using an FPGA chip and these devices. The modi?ed Hebbian learning is proposed as a learning rule.
2:Sample Selection and Data Sources:
Double-layer AOS thin-?lm devices are fabricated using a quartz glass substrate, Ti thin-?lm electrodes, and amorphous Ga-Sn-O (a-GTO) thin-?lm layers.
3:List of Experimental Equipment and Materials:
Quartz glass substrate, Ti thin-?lm electrodes, a-GTO thin-?lm layers, FPGA chip.
4:Experimental Procedures and Operational Workflow:
The conductance deterioration of the devices is measured under bias voltage. The Hop?eld neural network is tested for letter recognition by learning and recognizing alphabet letters 'T' and 'L'.
5:Data Analysis Methods:
The electric current through the devices is measured to observe conductance deterioration. The letter recognition function is validated by comparing input and output pixel patterns.
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