研究目的
Investigation on Structural and Dielectric Properties of Silica Nanoparticles Incorporated Poly(Ethylene Oxide)/Poly(Vinyl Pyrrolidone) Blend Matrix Based Nanocomposites
研究成果
The study demonstrated that the incorporation of SiO2 nanoparticles significantly affects the morphological, structural, dielectric, and electrical properties of PEO-PVP blend matrix-based PNC films. The films exhibited frequency tunable dielectric behavior and low dielectric loss, making them suitable for applications in flexible-type organoelectronic devices and as dielectric substrates.
研究不足
The study is limited to the characterization of PNC films with SiO2 nanoparticles up to 5 wt% concentration. The effects of higher concentrations of SiO2 nanoparticles and other types of nanofillers were not investigated.
1:Experimental Design and Method Selection:
The PNC films were prepared by the solution-casting method using PEO and PVP as the polymer blend matrix and SiO2 nanoparticles as the inorganic filler. The films were characterized using SEM, XRD, FTIR spectroscopy, and DRS.
2:Sample Selection and Data Sources:
The samples were prepared with varying concentrations of SiO2 nanoparticles (0, 1, 3, and 5 wt%) in the PEO-PVP blend matrix.
3:List of Experimental Equipment and Materials:
SEM (Carl ZEISS EVO 18 microscope), XRD (PANalytical X′pert Pro multipurpose diffractometer), FTIR spectrometer (Agilent Technologies FTIR spectrometer (Cary 630)), LCR meter (Agilent technologies 4284A) equipped with the 16451B solid dielectric test fixture.
4:Experimental Procedures and Operational Workflow:
The PNC films were prepared by dissolving PEO and PVP in deionized water, dispersing SiO2 nanoparticles in the solution, casting the solution on a polypropylene dish, and drying at room temperature. The films were then characterized using the aforementioned techniques.
5:Data Analysis Methods:
The data obtained from SEM, XRD, FTIR, and DRS were analyzed to study the morphological, structural, dielectric, and electrical properties of the PNC films.
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SEM
EVO 18
Carl ZEISS
Characterization of the morphological properties of the PNC films
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XRD
X′pert Pro
PANalytical
Characterization of the crystallographic properties of the PNC films
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FTIR spectrometer
Cary 630
Agilent Technologies
Characterization of the polymer-nanoparticle interactions in the PNC films
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LCR meter
4284A
Agilent technologies
Measurement of the dielectric and electrical properties of the PNC films
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Solid dielectric test fixture
16451B
Agilent technologies
Measurement of the dielectric and electrical properties of the PNC films
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