研究目的
Investigating the effects of PbO–B2O3–BaO–SiO2 (PBBS) glass addition on the sintering, phase, and dielectric properties of Ba0.5Sr0.5TiO3 (BST0) ceramic for radio-frequency applications.
研究成果
The addition of PBBS glass significantly reduced the sintering temperature of BST0 ceramic without affecting its crystal structure. The BST10 composition showed the highest density and lowest sintering temperature. Dielectric properties were stable over microwave frequencies at room temperature, with BST10 exhibiting the highest dielectric constant and lowest dielectric loss. The synthesized ceramic is promising for radio-frequency applications.
研究不足
The study focuses on the effect of PBBS glass addition on BST0 ceramic properties, with limitations including the range of glass concentrations tested and the sintering temperature range explored.
1:Experimental Design and Method Selection
The BST0 ceramic was synthesized by the conventional solid-state reaction method, and the PBBS glass was formed by melting and quenching process. The PBBS glass with different weight percentages (3, 5, 8 and 10 wt%) was added to BST0 ceramic as a sintering aid.
2:Sample Selection and Data Sources
High-purity raw materials were used for the preparation of BST0 and PBBS glass. The BST0 ceramic was prepared by the conventional solid-state reaction method, and the PBBS glass was prepared by melting and quenching the mixture of raw materials.
3:List of Experimental Equipment and Materials
BaCO3, SrCO3, TiO2, PbO, H3BO3, SiO2, yttria-stabilized zirconia balls, acetone, polyvinyl alcohol (PVA) solution, LABSYSTM SETARAM Instrumentation for TG/DTA, Rigaku MiniflexII Desktop X-ray D, Novocontrol Alpha-A high-performance frequency analyzer, Agilent E4980A Precision LCR meter, ENA Model E5071C network analyzer, Perkin Elmer 577 FT-IR spectrometer, LabRAM-HR800 Raman spectrometer.
4:Experimental Procedures and Operational Workflow
The mixed powders were calcined, mixed with PBBS glass, pelletized, and sintered at various temperatures. Dielectric properties were measured over a wide frequency range, and structural characterization was performed using XRD, FTIR, and Raman spectroscopy.
5:Data Analysis Methods
Rietveld refinement was used for XRD data analysis. Dielectric properties were analyzed over a wide frequency range, and structural characterization was performed using FTIR and Raman spectroscopy.
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Rigaku MiniflexII
Desktop X-ray D
Rigaku
X-ray diffractometer
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BaCO3
Thomas Baker
Raw material for BST0 ceramic preparation
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SrCO3
Thomas Baker
Raw material for BST0 ceramic preparation
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TiO2
Loba Chemie
Raw material for BST0 ceramic preparation
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PbO
Mallinckrodt Inc.
Raw material for PBBS glass preparation
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H3BO3
Thomas Baker
Raw material for PBBS glass preparation
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SiO2
Hi Media
Raw material for PBBS glass preparation
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LABSYSTM SETARAM Instrumentation
Serial no: 1-3347-1 DTA/TGA/DSC
SETARAM
Thermogravimetric/Differential thermal analysis
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Novocontrol Alpha-A
Novocontrol
High-performance frequency analyzer
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Agilent E4980A Precision
Agilent
LCR meter
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ENA Model E5071C
Keysight Technologies
Network analyzer
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Perkin Elmer 577 FT-IR spectrometer
Perkin Elmer
FT-IR spectra recording
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LabRAM-HR800
Raman spectroscopy
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