研究目的
To present a measurement technique derived from a field-dependent magnetic force microscope (MFM) for the measurement of local hysteresis loops on patterned micrometric and sub-micrometric magnetic structures.
研究成果
The experimental setup allows for the measurement of local hysteresis loops on micro-and nanometric patterned structures, providing access to all relevant irreversible magnetisation reversal processes. The system has been properly calibrated for accurate field values applied to the sample.
研究不足
The technique does not require calibration of the response of the MFM tip unless a quantitative measurement of the sample magnetisation is required. The setup is sensitive to variations of the magnetic properties of the sample without significant artifacts up to applied fields of ≈ 1000 Oe.
1：Experimental Design and Method Selection:
The technique involves synchronising the applied field variations with the end-of-line signal of the microscope, disabling the slow scan axis to allow a single MFM image to contain the whole field evolution of the magnetisation processes.
2：Sample Selection and Data Sources:
A patterned magnetic sample, specifically a Ni80Fe20 dot with a lateral size of 2μm and a thickness of 30 nm, is imaged.
3：List of Experimental Equipment and Materials:
A Bruker Nanoscope V Multimode 8 microscope equipped with a fully non-magnetic scanner, head, and tip holder, coupled with an electromagnet.
4：Experimental Procedures and Operational Workflow:
The sample is imaged in intermittent contact mode, with the magnetic signal acquired in lift mode using the phase channel. A profile of the dot is repeatedly scanned by disabling the slow scan axis.
5：Data Analysis Methods:
The 'phase contrast' at the patterned structure edges is analyzed to investigate the magnetisation reversal processes.
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