研究目的
Investigating the structural, microstructural, and dielectric properties of lead-free Bi0.5Na0.5TiO3 (BNT) ceramics for potential applications in high frequency tunable devices.
研究成果
The BNT ceramics exhibited high dielectric constant, low dielectric loss, and nearly constant loss over a wide range of frequency, making them suitable for high performance piezoelectric and microwave tunable device applications. The study provides insights into the structural, microstructural, and dielectric properties of BNT ceramics, highlighting their potential in high frequency applications.
研究不足
The study focuses on the dielectric and AC-conductivity analysis of BNT ceramics in specific frequency and temperature ranges. Potential areas for optimization include exploring other synthesis methods and extending the study to other lead-free piezoelectric materials.
1:Experimental Design and Method Selection:
The study employed conventional solid state reaction method for preparing BNT ceramics. Structural properties were analyzed using Rietveld refinement method and Raman spectroscopy. Dielectric properties were investigated over a broad frequency and temperature range.
2:Sample Selection and Data Sources:
Highly pure Bi2O3, Na2CO3, and TiO2 were used as starting materials. Samples were sintered at temperatures ranging from 1050 to 1150 oC.
3:List of Experimental Equipment and Materials:
Planetary ball mill (M/s Fritsch GmbH, Germany, Pulverisette 6), x-ray diffractometer (M/s Rigaku, TTRAX III 18 KW), Raman spectrometer (M/s Horiba Jobin Yvon, LABRAM HR), Field emission scanning electron microscope (FESEM) (M/s Zeiss, Sigma), RF impedance material Analyzer (M/s Agilent Technologies, E4991A and M/s Novocontrol, BDS 2200).
4:0). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Powders were mixed, calcined, ground, pressed into pellets, sintered, and then characterized for structural, microstructural, and dielectric properties.
5:Data Analysis Methods:
Rietveld refinement for structural analysis, Arrhenius law and Jonscher’s power law for analyzing AC-conductivity.
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X-ray diffractometer
TTRAX III 18 KW
Rigaku
Characterizing structural properties of BNT ceramics
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Field emission scanning electron microscope
Sigma
Zeiss
Analyzing microstructure and surface morphology of the ceramics
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RF impedance material Analyzer
E4991A
Agilent Technologies
Measuring temperature and frequency dependence of dielectric properties
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Bi2O3
Alfa-Aesar
Starting material for preparing BNT ceramics
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Na2CO3
Sigma Aldrich
Starting material for preparing BNT ceramics
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TiO2
Sigma-Aldrich
Starting material for preparing BNT ceramics
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Planetary ball mill
Pulverisette 6
Fritsch GmbH
Mixing powders for BNT ceramics preparation
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Raman spectrometer
LABRAM HR
Horiba Jobin Yvon
Analyzing structural properties of BNT ceramics
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RF impedance material Analyzer
BDS 2200
Novocontrol
Measuring temperature and frequency dependence of dielectric properties
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