研究目的
To measure scattering and improve the measurement of reflection, transmission and absorption, a scatterometer has been designed and fabricated to operate in the 50 -750 GHz region of the spectrum.
研究成果
The scatterometer for use in the millimetre and sub-millimetre wave parts of the spectrum has been successfully designed and fabricated. Early results indicate the instrument is functioning as designed, capable of measuring scattering from smooth and rough metal targets and smooth dielectrics. Future tests will extend the region of operation to the sub-millimetre wave.
研究不足
The original data as measured by the Network Analyser did not have the required signal to noise for certain types of extraction, with calibrated S parameters oscillating above ~65 GHz. More averaging or a lower IF bandwidth set in the Network Analyser is needed for better results.