研究目的
To demonstrate a micron-scale IR spectrometer with spectrally selective detection performed optoelectronically, based on the wavelength-dependent mid-IR photocurrent responses of an array of Al grating-based detectors fabricated on a doped Si substrate, and to show the application of compressive sensing techniques to enhance resolution.
研究成果
The work demonstrates a CMOS-compatible, readily scalable approach for the fabrication of compact, room-temperature IR spectrometers capable of use in fieldable applications. The use of compressive sensing techniques allows for spectral features to be identified with a remarkably small number of detectors, enhancing the resolution beyond the Shannon-Nyquist limit.
研究不足
The resolution of the spectrometer is limited by the number of grating elements, and the technique requires assumptions about the nature of the input signal for compressive sensing to be effective.
1：Experimental Design and Method Selection:
The spectrometer utilizes plasmonic aluminum gratings on highly p-doped silicon substrates for photodetection. The detection mechanism is based on the change in device resistance due to free-carrier absorption in the doped silicon substrate.
2：Sample Selection and Data Sources:
The gratings were fabricated using standard electron-beam lithography and clean room procedures.
3：List of Experimental Equipment and Materials:
High purity aluminum gratings on highly p-doped silicon substrates, PMMA A4 as an electron-beam resist, and a tunable mid-IR laser for characterization.
4：Experimental Procedures and Operational Workflow:
The photodetection mechanism was characterized by measuring the current through each grating while illuminated with a focused tunable mid-IR laser.
5：Data Analysis Methods:
Compressive sensing techniques were used for spectral reconstruction, enabling spectral features to be identified with a small number of detectors.
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