研究目的
To study the bulk and surface chemistry of a ferroan platinum crystal from the Kondyor Massif using X-ray photoelectron spectroscopy and Raman microscopy, confirming its composition and identifying surface materials without destructive sample preparation.
研究成果
XPS confirmed the crystal as ferroan platinum with 18.3 atom% Fe, aligning with previous studies. Raman spectroscopy revealed Pt-Pt stretching modes and orientation-dependent bands, indicating structural effects from Fe substitution. Surface analysis suggested a clinopyroxene-like silicate, consistent with the crystal's origin. The non-destructive nature of XPS and Raman microscopy was highlighted as advantageous over destructive methods.
研究不足
Interferences in XPS spectra (e.g., Al 2p with Pt 4f, Mg 2p with Fe 3p, Ca 2p1/2 with Mg Auger) made exact element ratio determinations difficult. The surface silicate could not be precisely identified. Detection limits for elements like gold were around 0.1 atom%, and no gold alloys were observed on this crystal.
1:Experimental Design and Method Selection:
The study used X-ray photoelectron spectroscopy (XPS) and Raman microscopy to analyze a ferroan platinum crystal non-destructively. XPS was chosen for surface and bulk chemical analysis, and Raman microscopy for structural insights.
2:Sample Selection and Data Sources:
A single ferroan platinum crystal (approximately 5 x
3:5 x 5 mm, sample no. 4563) from the Kondyor Massif placer deposit was used. List of Experimental Equipment and Materials:
Equipment included a Philips PW1050/25 vertical goniometer for XRD, a Kratos AXIS Ultra XPS instrument with a monochromatic Al X-ray source, and a Renishaw 1000 Raman microscope system with an Olympus BHSM microscope and HeNe laser. Materials included the platinum crystal and reference standards.
4:Experimental Procedures and Operational Workflow:
XRD was performed first to confirm the crystal nature. For XPS, the crystal was outgassed overnight, then survey and high-resolution scans were conducted. Raman spectra were collected using a 633 nm laser with specific objectives and calibrated grating.
5:Data Analysis Methods:
XPS data were calibrated using C 1s peak at 284.8 eV. Raman data were analyzed using Fytik software for baseline adjustment, smoothing, and band fitting with Gauss-Lorentz functions.
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