摘要： In this paper, we describe the behavior of the spurios resonance caused by shear-horizontal (SH) type surface acoustic wave (SAW) devices in low acoustic velocity (LAV) Rayleigh-type SAW structures. It is well known that an SH-type SAW or Rayleigh-type SAW device appears near the main resonance on LiNbO3 (LN) substrates, which causes various undesired effects on the device characteristics. However, they are often non-negligible in practical use. In order to explore a solution of this problem, we theoretically and experimentally investigated the variation of the SH-type SAW resonance in the low acoustic velocity (LAV) Rayleigh-type SAW structure on LN substrates, which is a new LAV-SAW structure with a higher performance temperature-compensated (TC) SAW device (TC-SAW) technology. As a result, we revealed that the SH-type SAW can be almost zero even if various parameters are changed. Moreover, very small sized and TC-SAW devices can be realized using this new technology.