研究目的
Investigating the calculation and reduction of the minimum thickness of glass fuse for Zr Kα line analysis in phosphorus-containing zircon-refractory materials to address line overlap issues in X-ray fluorescence spectrometry.
研究成果
The research successfully calculated and reduced the critical thickness of glass fuse for Zr Kα line analysis by adding calcium oxide additives, improving measurement sensitivity and accuracy in XRF analysis for zircon-refractory materials with phosphorus content.
研究不足
The study is specific to phosphorus-containing zircon-refractory materials and relies on theoretical models that may have approximations; practical limitations include the difficulty in handling very thick glass fuses and the need for precise additive proportions.
1：Experimental Design and Method Selection:
The study uses theoretical calculations based on mass absorption coefficients and X-ray fluorescence spectrometry to determine critical thickness, with experimental verification involving sample preparation and measurement.
2：Sample Selection and Data Sources:
Samples are phosphorus-containing zircon-refractory materials, prepared with specific fluxes and additives; data include intensity measurements from XRF.
3：List of Experimental Equipment and Materials:
ZSX Primus II X-Ray fluorescence spectroscopy (Rigaku), Automatic fusion machine TNRY-01A (Luoyang Tenai Laboratory Equipment Co., LTD), platinum gold crucibles, lithium tetraborate, lithium metaborate, calcium carbonate, ferric oxide, LiBr solution.
4：Experimental Procedures and Operational Workflow:
Samples and fusing agents are burned, mixed with fluxes and additives, melted at 1100°C for 20 minutes, cooled, and analyzed using XRF under specified conditions (e.g., voltage 50 kV, current 50 mA).
5：Data Analysis Methods:
Calculation of mass absorption coefficients using Thinh-Leroux method, critical thickness via formula t = 91.6 / (ρ * μ*), and statistical analysis of measurement intensities to assess precision and accuracy.
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