研究目的
Investigating the even-odd effect in higher-order holographic production of electron vortex beams with nontrivial radial structures, focusing on how radial indices behave under phase amplification in diffraction orders.
研究成果
Higher-order diffraction from binary CGEHs amplifies azimuthal indices proportionally to the diffraction order but exhibits an even-odd effect for radial indices: even orders reduce radial indices to zero, while odd orders preserve them. This effect is explained by phase amplification of radial profiles. The orthonormal basis set enables new applications in electron microscopy, though practical limitations exist due to binarization and aberrations.
研究不足
The binarization process and phase amplification may not perfectly reproduce radial structures, especially for even diffraction orders, leading to deviations from pure states. Lens aberrations and envelope effects from beam-blocking bars in the hologram can modify results. The method is limited to specific modes and may not generalize to all structured beams.
1:Experimental Design and Method Selection:
The study uses a binary computer-generated electron hologram (CGEH) to produce Fourier transforms of truncated Bessel beams (TBBs) at the focal plane of an electron microscope. The methodology involves encoding specific TBB modes with defined azimuthal and radial indices, binarizing the transmission function, and analyzing higher-order diffraction effects.
2:Sample Selection and Data Sources:
The samples are gold-plated silicon nitride membranes with binary holographic patterns fabricated using focused ion-beam lithography, encoding modes such as TBB01, TBB11, and TBB
3:List of Experimental Equipment and Materials:
A field-emission transmission electron microscope (JEOL 2200FS) operating at 200 kV, binary CGEH masks, and astigmatic control components for transformation optics.
4:Experimental Procedures and Operational Workflow:
The CGEH is inserted at the specimen plane; diffraction patterns are recorded at the back focal plane in low-magnification mode. Astigmatic transformation is applied by introducing astigmatism via microscope controls to analyze phase structures.
5:Data Analysis Methods:
Simulation of diffraction patterns using Fourier transforms, comparison with experimental results, and analysis of astigmatically transformed beams to identify azimuthal and radial indices.
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