研究目的
To synthesize and characterize the semi-organic complex samarium chloride-thiourea-l-tartaric acid (SCTuT) for its structural, spectroscopic, thermal, linear, and nonlinear optical properties, aiming to explore its potential in nonlinear optical applications.
研究成果
The SCTuT semi-organic complex exhibits orthorhombic structure, high crystallinity, rod-like morphology, confirmed elemental composition, and functional groups through spectroscopy. It has a melting point of 178°C, sufficient optical transmittance with a UV cut-off at 350 nm, direct band gap of 4.11 eV, low extinction coefficient and refractive index, and finite third-order nonlinear susceptibility (order of 10^{-14} esu). These properties make it a promising candidate for nonlinear optical applications, such as frequency conversion and optoelectronic devices. Future studies could focus on device integration and comparative analysis with other materials.
研究不足
The study is limited to the specific SCTuT complex; generalizability to other semi-organic materials may require further investigation. The crystal size was small (up to 1.5 × 3 × 1 mm), which might affect certain measurements. The use of specific equipment and conditions (e.g., nitrogen atmosphere for TGA) could introduce constraints. Potential optimizations include scaling up crystal growth for larger samples or exploring different doping ratios.
1:Experimental Design and Method Selection:
The study employed slow evaporation technique for crystal growth, followed by various characterization methods including X-ray diffraction, SEM, EDX, FTIR, Raman spectroscopy, TGA/DTA, UV-Vis spectroscopy, and Z-scan experiments to analyze structural, morphological, elemental, vibrational, thermal, linear optical, and nonlinear optical properties. Theoretical models like Tauc's relation were used for optical band gap determination.
2:Sample Selection and Data Sources:
Single crystals of SCTuT were grown from a solution of thiourea, L-tartaric acid, and samarium chloride in distilled water. Samples were prepared as powders or single crystals for different analyses.
3:List of Experimental Equipment and Materials:
Chemicals included thiourea (S D Fine-Chem Limited, 99% purity), L-tartaric acid (S D Fine-Chem Limited, 99% purity), samarium chloride (Indian Rare Earth Limited, 99% purity), distilled water, Whatman filter paper. Equipment included magnetic stirrer, Oxford X-ray diffractometer, Rigaku Ultima IV diffractometer, TESCAN Vega III SEM, EDX (Brucker), Shimadzu IR Prestige spectrophotometer, Renishaw Raman spectrophotometer, Shimadzu TGA/DTA analyzer, Shimadzu UV3600 spectrophotometer, Ti:sapphire laser for Z-scan, and related accessories like lenses and photodiodes.
4:Experimental Procedures and Operational Workflow:
Crystals were grown by slow evaporation, filtered, and characterized step-by-step: structural analysis with X-ray diffraction, morphological with SEM, elemental with EDX, vibrational with FTIR and Raman, thermal with TGA/DTA, linear optical with UV-Vis, and nonlinear optical with Z-scan experiments. Specific procedures involved sample preparation, data collection at controlled conditions (e.g., temperature ranges, laser parameters), and data analysis.
5:Data Analysis Methods:
Data were analyzed using software like Powder-X for XRD, theoretical fitting for Z-scan (equations for nonlinear coefficients), Tauc's plot for band gap, and standard formulas for optical constants (e.g., extinction coefficient, refractive index). Statistical methods included linear fitting for parameter extraction.
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FTIR spectrophotometer
IR Prestige
Shimadzu
Used for Fourier transform infrared spectroscopy to analyze functional groups.
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UV-Vis spectrophotometer
Shimadzu UV3600
Shimadzu
Used for linear optical studies to measure absorbance, transmittance, and reflectance.
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Microscope
Leica DM 2500
Leica
Used with Raman spectrophotometer to focus laser beam on sample.
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X-ray diffractometer
Oxford X-ray diffractometer
Oxford
Used for single crystal X-ray diffraction to determine unit cell parameters and structure.
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X-ray powder diffractometer
Rigaku Ultima IV
Rigaku
Used for powder X-ray diffraction to confirm crystallinity and purity.
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Scanning electron microscope
TESCAN Vega III
TESCAN
Used for morphological analysis to observe surface microstructure.
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Energy dispersive X-ray analyzer
Brucker
Used for elemental composition analysis.
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Raman spectrophotometer
Renishaw
Used for Raman spectroscopy to study vibrational modes.
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TGA/DTA analyzer
Shimadzu
Used for thermogravimetric and differential thermal analysis to study thermal stability and effects.
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Laser
Ti:sapphire laser
Used for Z-scan experiments to measure nonlinear optical properties.
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Lens
Converging lens
Used to focus laser beam in Z-scan experiments.
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Photodiode
Fast photodiode
Used to capture transmitted light in Z-scan experiments.
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Magnetic stirrer
Used for stirring the solution during crystal preparation.
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Filter paper
Whatman filter paper
Whatman
Used for filtering the solution.
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