研究目的
To investigate the effect of Gd3+ doping on the microstructure and surface morphology of BaTiO3 thin films fabricated using the sol-gel method.
研究成果
Gd doping in BaTiO3 thin films leads to substitution at Ba-sites, causing lattice distortion, reduced crystallite and grain sizes, increased microstrain and dislocation density, and decreased surface roughness. The microstructure and morphology are highly dependent on Gd concentration due to ionic size effects, with implications for optoelectronic applications.
研究不足
The study is limited to specific Gd doping concentrations and annealing conditions; the formation of secondary silicate phases due to Si diffusion may affect film properties, and the use of a single buffer layer thickness could be optimized. The AFM analysis is confined to surface morphology without electrical or optical property measurements.
1：Experimental Design and Method Selection:
The study uses sol-gel synthesis and spin-coating technique to fabricate Gd-doped BaTiO3 thin films on SiO2/Si substrates, followed by annealing at 900°C. XRD and AFM are employed for structural and morphological characterization.
2：Sample Selection and Data Sources:
Thin films with different Gd doping ratios (x = 0,
3：05, 1, 15, 2) are prepared. Silicon substrates are cleaned and coated with a 15 nm SiO2 buffer layer. List of Experimental Equipment and Materials:
Barium acetate, gadolinium acetate, titanium(IV) isopropoxide, glacial acetic acid, 2-methoxyethanol, nylon syringe filter, spin coater, X-ray diffractometer (XRD, D2 Phaser, Bruker), atomic force microscopy (AFM, SPA400, SII Nanotechnology, Inc).
4：Experimental Procedures and Operational Workflow:
Solutions are prepared by dissolving precursors, refluxing, filtering, and spin-coating onto substrates at 4000 rpm for 20 seconds, followed by post-heating at 200°C and annealing at 900°C. XRD scans from 20° to 60° with Cu-Kα radiation, and AFM scans in contact mode over 5 μm x 5 μm and 1 μm x 1 μm areas.
5：Data Analysis Methods:
Lattice parameters calculated using tetragonal phase geometry, crystallite size using Scherrer equation, dislocation density and microstrain from XRD data, and surface roughness parameters extracted using Gwyddion software.
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